Teraherzová emise z tabulárních nanostruktur Pb(Zr,Ti)O3.

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F08%3A00319825" target="_blank" >RIV/68378271:_____/08:00319825 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Terahertz emmision from tubular Pb(Zr,Ti)O3 nanostructures

Popis výsledku v původním jazyce

We report intense THz emission from lead zirconate-titanate (PZT) nanotube arrays, which is totally absent in flat films or bulk; hence the effect is due to the nano-scale geometry of the films, which are 40 nm thick on n-Si substrates. The THz radiationis emitted within 0.2 ps, and the spectrum exhibits a broad peak from 2 to 8 THz. This is a gap in the frequency spectrum of semiconductor THz devices, such as ZnTe and an order of magnitude higher frequency peak than that in the well-studied p-InAs, due to the abnormally large carrier concentration gradient in PZT; the inferred mechanism is optical rectification within a surface accumulation layer, rather than the Dember effect. THz reflectivity is also characterized. The THz emission is optically pumped, but since the tubes exhibit ferroelectric switching, electrically driven emission may also be possible. EPR reveals O2 molecules adsorbed onto the nanotubes, which may play some role in the emission.

Název v anglickém jazyce

Terahertz emmision from tubular Pb(Zr,Ti)O3 nanostructures

Popis výsledku anglicky

We report intense THz emission from lead zirconate-titanate (PZT) nanotube arrays, which is totally absent in flat films or bulk; hence the effect is due to the nano-scale geometry of the films, which are 40 nm thick on n-Si substrates. The THz radiationis emitted within 0.2 ps, and the spectrum exhibits a broad peak from 2 to 8 THz. This is a gap in the frequency spectrum of semiconductor THz devices, such as ZnTe and an order of magnitude higher frequency peak than that in the well-studied p-InAs, due to the abnormally large carrier concentration gradient in PZT; the inferred mechanism is optical rectification within a surface accumulation layer, rather than the Dember effect. THz reflectivity is also characterized. The THz emission is optically pumped, but since the tubes exhibit ferroelectric switching, electrically driven emission may also be possible. EPR reveals O2 molecules adsorbed onto the nanotubes, which may play some role in the emission.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2008

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nano Letters

ISSN

1530-6984

e-ISSN

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Svazek periodika

8

Číslo periodika v rámci svazku

12

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

6

Strana od-do

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Kód UT WoS článku

000261630700055

EID výsledku v databázi Scopus

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