The monitoring and the real-time control of an ultra-thin silver layer growth
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F09%3A00339879" target="_blank" >RIV/68378271:_____/09:00339879 - isvavai.cz</a>
Výsledek na webu
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DOI - Digital Object Identifier
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Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
The monitoring and the real-time control of an ultra-thin silver layer growth
Popis výsledku v původním jazyce
Silver is one of the most suitable materials for a fabrication of metal-dielectric optical devices due to its unique optical constants. The final performance of such devices significantly depends on a quality of the silver-dielectrics interface. This interface is mainly affected during the initial nucleation of the silver on a substrate. Therefore we focused our attention on a study of this stage of the silver growth. The silver layers were deposited by the magnetron sputtering. The initial stage of thenucleation and the layer growth was studied by means of an optical monitoring, which is based on a principle of spectrophotometric measurement of sample reflectivity. The measured data were fitted to a model including Fresnel coefficients. The non-continual (Volmer-Weber) mode of the layer nucleation was clearly distinguished in the monitored data. The non-continual layer was modeled by means of effective media approximations.
Název v anglickém jazyce
The monitoring and the real-time control of an ultra-thin silver layer growth
Popis výsledku anglicky
Silver is one of the most suitable materials for a fabrication of metal-dielectric optical devices due to its unique optical constants. The final performance of such devices significantly depends on a quality of the silver-dielectrics interface. This interface is mainly affected during the initial nucleation of the silver on a substrate. Therefore we focused our attention on a study of this stage of the silver growth. The silver layers were deposited by the magnetron sputtering. The initial stage of thenucleation and the layer growth was studied by means of an optical monitoring, which is based on a principle of spectrophotometric measurement of sample reflectivity. The measured data were fitted to a model including Fresnel coefficients. The non-continual (Volmer-Weber) mode of the layer nucleation was clearly distinguished in the monitored data. The non-continual layer was modeled by means of effective media approximations.
Klasifikace
Druh
O - Ostatní výsledky
CEP obor
BM - Fyzika pevných látek a magnetismus
OECD FORD obor
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Návaznosti výsledku
Projekt
Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.
Návaznosti
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Ostatní
Rok uplatnění
2009
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů