Probing structure and microstructure of epitaxial Ni?Mn?Ga films by reciprocal space mapping and pole figure measurements

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F10%3A00353131" target="_blank" >RIV/68378271:_____/10:00353131 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Probing structure and microstructure of epitaxial Ni?Mn?Ga films by reciprocal space mapping and pole figure measurements

Popis výsledku v původním jazyce

The crystal structure and complex twinning microstructure of epitaxial Ni?Mn?Ga films on (1 0 0) MgO substrates was studied by X-ray diffraction using 2? scans, pole figure measurements and reciprocal space mapping (RSM). Above the martensitic transformation temperature the film consists of single austenite phase with lattice constant a = 5.81A at 419 K. At room temperature some epitaxially grown residual austenite with a = 5.79A remains at the interface with the substrate, followed by an intermediate layer exhibiting orthorhombic distortion, atrans = 6.05A, btrans = 5.87A, ctrans = 5.73A and a major fraction of 14M (7M) martensite, a = 6.16A, b = 5.79A, c = 5.48A. The seven-layered modulation of this metastable martensite structure is directly observed by RSM. The intermediate phase observed close to interface indicates the existence of an instable, pre-adaptive martensite phase with a short stacking period.

Název v anglickém jazyce

Probing structure and microstructure of epitaxial Ni?Mn?Ga films by reciprocal space mapping and pole figure measurements

Popis výsledku anglicky

The crystal structure and complex twinning microstructure of epitaxial Ni?Mn?Ga films on (1 0 0) MgO substrates was studied by X-ray diffraction using 2? scans, pole figure measurements and reciprocal space mapping (RSM). Above the martensitic transformation temperature the film consists of single austenite phase with lattice constant a = 5.81A at 419 K. At room temperature some epitaxially grown residual austenite with a = 5.79A remains at the interface with the substrate, followed by an intermediate layer exhibiting orthorhombic distortion, atrans = 6.05A, btrans = 5.87A, ctrans = 5.73A and a major fraction of 14M (7M) martensite, a = 6.16A, b = 5.79A, c = 5.48A. The seven-layered modulation of this metastable martensite structure is directly observed by RSM. The intermediate phase observed close to interface indicates the existence of an instable, pre-adaptive martensite phase with a short stacking period.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Acta Materialia

ISSN

1359-6454

e-ISSN

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Svazek periodika

58

Číslo periodika v rámci svazku

20

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

7

Strana od-do

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Kód UT WoS článku

000284446500012

EID výsledku v databázi Scopus

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