AFM topographies of densely packed nanoparticles: a quick way to determine the lateral size distribution by autocorrelation function analysis

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F12%3A00383750" target="_blank" >RIV/68378271:_____/12:00383750 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21460/12:00198075

Výsledek na webu

<a href="http://dx.doi.org/10.1007/s11051-012-1062-7" target="_blank" >http://dx.doi.org/10.1007/s11051-012-1062-7</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1007/s11051-012-1062-7" target="_blank" >10.1007/s11051-012-1062-7</a>

Jazyk výsledku

angličtina

Název v původním jazyce

AFM topographies of densely packed nanoparticles: a quick way to determine the lateral size distribution by autocorrelation function analysis

Popis výsledku v původním jazyce

The distribution of sizes is one of the basic characteristics of nanoparticles. Here, we propose a novel way to determine the lateral distribution of sizes from AFM topographies. Our algorithm is based on the autocorrelation function and can be applied both on topographies containing spatially separated and densely packed nanoparticles as well as on topographies of polycrystalline films. As no manual treatment is required, this algorithm can be easily automatable for batch processing. The algorithm works in principle with any kind of spatially mapped information (AFM current maps, optical microscope images, etc.), and as such has no size limitations. However, in the case of AFM topographies, the tip/sample convolution effects will be the factor limiting the smallest size to which the algorithm is applicable. Here, we demonstrate the usefulness of this algorithm on objects with sizes ranging between 20 nm and 1.5 ?m.

Název v anglickém jazyce

AFM topographies of densely packed nanoparticles: a quick way to determine the lateral size distribution by autocorrelation function analysis

Popis výsledku anglicky

The distribution of sizes is one of the basic characteristics of nanoparticles. Here, we propose a novel way to determine the lateral distribution of sizes from AFM topographies. Our algorithm is based on the autocorrelation function and can be applied both on topographies containing spatially separated and densely packed nanoparticles as well as on topographies of polycrystalline films. As no manual treatment is required, this algorithm can be easily automatable for batch processing. The algorithm works in principle with any kind of spatially mapped information (AFM current maps, optical microscope images, etc.), and as such has no size limitations. However, in the case of AFM topographies, the tip/sample convolution effects will be the factor limiting the smallest size to which the algorithm is applicable. Here, we demonstrate the usefulness of this algorithm on objects with sizes ranging between 20 nm and 1.5 ?m.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BM - Fyzika pevných látek a magnetismus

OECD FORD obor

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Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Nanoparticle Research

ISSN

1388-0764

e-ISSN

—

Svazek periodika

14

Číslo periodika v rámci svazku

8

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

10

Strana od-do

1-10

Kód UT WoS článku

000307273400085

EID výsledku v databázi Scopus

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