Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F16%3A00488135" target="_blank" >RIV/68378271:_____/16:00488135 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1107/S2053273316001959" target="_blank" >http://dx.doi.org/10.1107/S2053273316001959</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1107/S2053273316001959" target="_blank" >10.1107/S2053273316001959</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I

Popis výsledku v původním jazyce

This paper reports computer simulations of the transmitted-beam intensity distribution for the case of six-beam (000, 220, 242, 044,224,202) diffraction of X-rays in a perfect silicon crystal of thickness 1 mm. Both the plane-wave angular dependence and the six-beam section topographs, which are usually obtained in experiments with a restricted beam (two-dimensional slit), are calculated. The angular dependence is calculated in accordance with Ewald's theory. The section topographs are calculated from the angular dependence by means of the fast Fourier transformation procedure. This approach allows one to consider, for the first time, the transformation of the topograph's structure due to the two-dimensional slit sizes and the distance between the slit and the detector. The results are in good agreement with the results of other works and with the experimental data.

Název v anglickém jazyce

Computer simulations of X-ray six-beam diffraction in a perfect silicon crystal. I

Popis výsledku anglicky

This paper reports computer simulations of the transmitted-beam intensity distribution for the case of six-beam (000, 220, 242, 044,224,202) diffraction of X-rays in a perfect silicon crystal of thickness 1 mm. Both the plane-wave angular dependence and the six-beam section topographs, which are usually obtained in experiments with a restricted beam (two-dimensional slit), are calculated. The angular dependence is calculated in accordance with Ewald's theory. The section topographs are calculated from the angular dependence by means of the fast Fourier transformation procedure. This approach allows one to consider, for the first time, the transformation of the topograph's structure due to the two-dimensional slit sizes and the distance between the slit and the detector. The results are in good agreement with the results of other works and with the experimental data.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10305 - Fluids and plasma physics (including surface physics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Acta Crystallographica A-Foundation and Advances

ISSN

2053-2733

e-ISSN

—

Svazek periodika

72

Číslo periodika v rámci svazku

May

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

8

Strana od-do

349-356

Kód UT WoS článku

000375147400009

EID výsledku v databázi Scopus

2-s2.0-84965057155