Optical NIR-VIS-VUV constants of advanced substrates for thin-film devices

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F17%3A00479805" target="_blank" >RIV/68378271:_____/17:00479805 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21340/17:00317031

Výsledek na webu

<a href="http://dx.doi.org/10.1364/OME.7.003844" target="_blank" >http://dx.doi.org/10.1364/OME.7.003844</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OME.7.003844" target="_blank" >10.1364/OME.7.003844</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Optical NIR-VIS-VUV constants of advanced substrates for thin-film devices

Popis výsledku v původním jazyce

The optical properties of several commonly used single-crystal oxide substrates were explored by spectroscopic ellipsometry over a wide spectral range from 0.74 eV to 8.8 eV. The crystals examined are (100) SrTiO3, 0.7 % wt Nb-doped (100) SrTiO3,(100) (LaAlO3)0,29(SrAl0,5Ta0,5O3)0,7, (011) DyScO3, (100) MgAl2O4, (100) MgO, and (100) LaAlO3, all of which enable epitaxial growth of numerous perovskite-type and other optical thin films. An analytic form for the complex dielectric function was derived from ellipsometric data through a physically consistent modeling process. The obtained dielectric spectra were further utilized to calculate the complex index of refraction and absorption coefficient for each substrate material. The absorption spectra and optical band gap were analyzed using Tauc plots. The parameters for reconstructing the dielectric functions are given in detail, allowing for extensive applications of the results of this work.n

Název v anglickém jazyce

Optical NIR-VIS-VUV constants of advanced substrates for thin-film devices

Popis výsledku anglicky

The optical properties of several commonly used single-crystal oxide substrates were explored by spectroscopic ellipsometry over a wide spectral range from 0.74 eV to 8.8 eV. The crystals examined are (100) SrTiO3, 0.7 % wt Nb-doped (100) SrTiO3,(100) (LaAlO3)0,29(SrAl0,5Ta0,5O3)0,7, (011) DyScO3, (100) MgAl2O4, (100) MgO, and (100) LaAlO3, all of which enable epitaxial growth of numerous perovskite-type and other optical thin films. An analytic form for the complex dielectric function was derived from ellipsometric data through a physically consistent modeling process. The obtained dielectric spectra were further utilized to calculate the complex index of refraction and absorption coefficient for each substrate material. The absorption spectra and optical band gap were analyzed using Tauc plots. The parameters for reconstructing the dielectric functions are given in detail, allowing for extensive applications of the results of this work.n

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optical Materials Express

ISSN

2159-3930

e-ISSN

—

Svazek periodika

7

Číslo periodika v rámci svazku

11

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

19

Strana od-do

3844-3862

Kód UT WoS článku

000414248700006

EID výsledku v databázi Scopus

2-s2.0-85031403034