Anisotropic strain in rare-earth substituted ceria thin films probed by polarized Raman spectroscopy and first-principles calculations

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00537684" target="_blank" >RIV/68378271:_____/20:00537684 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1021/acsami.0c14249" target="_blank" >https://doi.org/10.1021/acsami.0c14249</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acsami.0c14249" target="_blank" >10.1021/acsami.0c14249</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Anisotropic strain in rare-earth substituted ceria thin films probed by polarized Raman spectroscopy and first-principles calculations

Popis výsledku v původním jazyce

We propose a method for measuring strain in rare-earth doped ceria thin films by polarized Raman spectroscopy. We study epitaxial CeO2 films substituted by La, Gd, and Yb grown on MgO substrates with BaZrO3 and SrTiO3 interlayers, where different levels of strain are generated by annealing at distinct temperatures. The films show in-plane compression and out-of-plane expansion, resulting in a lowering from the bulk cubic to tetragonal lattice symmetry. This leads to the splitting of the F2g Raman mode in the cubic phase to B2g and Eg modes in the tetragonal lattice. The symmetry and frequency of these modes are determined by polarized Raman in the backscattering and right-angle scattering geometries as well as by first-principal calculations. The frequency splitting of the two modes is proportional to the strain measured by X-ray diffraction and its magnitude agrees with first-principles calculations.

Název v anglickém jazyce

Anisotropic strain in rare-earth substituted ceria thin films probed by polarized Raman spectroscopy and first-principles calculations

Popis výsledku anglicky

We propose a method for measuring strain in rare-earth doped ceria thin films by polarized Raman spectroscopy. We study epitaxial CeO2 films substituted by La, Gd, and Yb grown on MgO substrates with BaZrO3 and SrTiO3 interlayers, where different levels of strain are generated by annealing at distinct temperatures. The films show in-plane compression and out-of-plane expansion, resulting in a lowering from the bulk cubic to tetragonal lattice symmetry. This leads to the splitting of the F2g Raman mode in the cubic phase to B2g and Eg modes in the tetragonal lattice. The symmetry and frequency of these modes are determined by polarized Raman in the backscattering and right-angle scattering geometries as well as by first-principal calculations. The frequency splitting of the two modes is proportional to the strain measured by X-ray diffraction and its magnitude agrees with first-principles calculations.

Druh

J_SC - Článek v periodiku v databázi SCOPUS

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

<a href="/cs/project/GX19-28594X" target="_blank" >GX19-28594X: Feroelektrické skyrmiony</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2020

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

ACS Applied Materials and Interfaces

ISSN

1944-8244

e-ISSN

—

Svazek periodika

12

Číslo periodika v rámci svazku

50

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

9

Strana od-do

56251-56259

Kód UT WoS článku

000600202300068

EID výsledku v databázi Scopus

2-s2.0-85097784735