Design and performance characterisation of the HAPG von Hámos spectrometer at the high energy density instrument of the european XFEL
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F20%3A00539405" target="_blank" >RIV/68378271:_____/20:00539405 - isvavai.cz</a>
Výsledek na webu
<a href="http://hdl.handle.net/11104/0317117" target="_blank" >http://hdl.handle.net/11104/0317117</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1088/1748-0221/15/11/P11033" target="_blank" >10.1088/1748-0221/15/11/P11033</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Design and performance characterisation of the HAPG von Hámos spectrometer at the high energy density instrument of the european XFEL
Popis výsledku v původním jazyce
The von Hámos spectrometer setup at the HED instrument of the European XFEL is described in detail. The spectrometer is designed to be operated primarily between 5 and 15 keV to complement the operating photon energy range of the HED instrument. Four Highly Annealed Pyrolitic Graphite (HAPG) crystals are characterised with thicknesses of 40 μm or 100 μm and radius-of-curvature 50 mm or 80 mm, in conjunction with either an ePix100 or Jungfrau detector. The achieved resolution with the 50 mm crystals, operated between 6.5 and 9 keV, matches that reported previously: ∼ 8 eV for a thickness of 40 μm, whereas, with an 80 mm crystal of thickness 40 μm, the resolution exceeds that expected. Namely, a resolution of 2 eV is demonstrated between 5–6 keV implying a resolving power of 2800. Therefore, we posit that flatter HAPG crystals, with their high reflectivity and improved resolving power, are a powerful tool for hard x-ray scattering and emission experiments.n
Název v anglickém jazyce
Design and performance characterisation of the HAPG von Hámos spectrometer at the high energy density instrument of the european XFEL
Popis výsledku anglicky
The von Hámos spectrometer setup at the HED instrument of the European XFEL is described in detail. The spectrometer is designed to be operated primarily between 5 and 15 keV to complement the operating photon energy range of the HED instrument. Four Highly Annealed Pyrolitic Graphite (HAPG) crystals are characterised with thicknesses of 40 μm or 100 μm and radius-of-curvature 50 mm or 80 mm, in conjunction with either an ePix100 or Jungfrau detector. The achieved resolution with the 50 mm crystals, operated between 6.5 and 9 keV, matches that reported previously: ∼ 8 eV for a thickness of 40 μm, whereas, with an 80 mm crystal of thickness 40 μm, the resolution exceeds that expected. Namely, a resolution of 2 eV is demonstrated between 5–6 keV implying a resolving power of 2800. Therefore, we posit that flatter HAPG crystals, with their high reflectivity and improved resolving power, are a powerful tool for hard x-ray scattering and emission experiments.n
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
10306 - Optics (including laser optics and quantum optics)
Návaznosti výsledku
Projekt
—
Návaznosti
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Ostatní
Rok uplatnění
2020
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Journal of Instrumentation
ISSN
1748-0221
e-ISSN
—
Svazek periodika
15
Číslo periodika v rámci svazku
11
Stát vydavatele periodika
GB - Spojené království Velké Británie a Severního Irska
Počet stran výsledku
15
Strana od-do
1-15
Kód UT WoS článku
000595650800020
EID výsledku v databázi Scopus
2-s2.0-85097960470