Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F21%3A00545328" target="_blank" >RIV/68378271:_____/21:00545328 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61389021:_____/21:00582247

Výsledek na webu

<a href="http://hdl.handle.net/11104/0322052" target="_blank" >http://hdl.handle.net/11104/0322052</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1038/s41598-021-84677-w" target="_blank" >10.1038/s41598-021-84677-w</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

Popis výsledku v původním jazyce

Spatially encoded measurements of transient optical transmissivity became a standard tool for temporal diagnostics of free-electron-laser (FEL) pulses, as well as for the arrival time measurements in X-ray pump and optical probe experiments. The modern experimental techniques can measure changes in optical coefficients with a temporal resolution better than 10 fs. Carrier transport within the material and out of its significantly decrease the number of carriers. This would strongly affect the transient optical properties, making the diagnostic measurement inaccurate. We analyze in detail the effects of those processes on the optical properties of XUV and soft X-ray irradiated Si3N4, on sub-picosecond timescales. Theoretical predictions are compared with the published results of two experiments at FERMI and LCLS facilities, and with our own recent measurement.

Název v anglickém jazyce

Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride

Popis výsledku anglicky

Spatially encoded measurements of transient optical transmissivity became a standard tool for temporal diagnostics of free-electron-laser (FEL) pulses, as well as for the arrival time measurements in X-ray pump and optical probe experiments. The modern experimental techniques can measure changes in optical coefficients with a temporal resolution better than 10 fs. Carrier transport within the material and out of its significantly decrease the number of carriers. This would strongly affect the transient optical properties, making the diagnostic measurement inaccurate. We analyze in detail the effects of those processes on the optical properties of XUV and soft X-ray irradiated Si3N4, on sub-picosecond timescales. Theoretical predictions are compared with the published results of two experiments at FERMI and LCLS facilities, and with our own recent measurement.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10305 - Fluids and plasma physics (including surface physics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Scientific Reports

ISSN

2045-2322

e-ISSN

2045-2322

Svazek periodika

11

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

DE - Spolková republika Německo

Počet stran výsledku

10

Strana od-do

5203

Kód UT WoS článku

000626140000031

EID výsledku v databázi Scopus

2-s2.0-85102084539