In situ monitoring of pulsed laser annealing of Eu-doped oxide thin films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F21%3A00552117" target="_blank" >RIV/68378271:_____/21:00552117 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/60461373:22340/21:43923189 RIV/00216208:11310/21:10437221

Výsledek na webu

<a href="http://hdl.handle.net/11104/0327271" target="_blank" >http://hdl.handle.net/11104/0327271</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.3390/ma14247576" target="_blank" >10.3390/ma14247576</a>

Jazyk výsledku

angličtina

Název v původním jazyce

In situ monitoring of pulsed laser annealing of Eu-doped oxide thin films

Popis výsledku v původním jazyce

Eu3+ doped oxide thin films possess a great potential for several emerging applications in optics, optoelectronics, and sensors. The applications demand maximizing Eu3+ photoluminescence response. Eu-doped ZnO, TiO2, and Lu2O3 thin films were deposited by Pulsed Laser Deposition (PLD). Pulsed UV Laser Annealing (PLA) was utilized to modify the properties of the films. In situ monitoring of the evolution of optical properties photoluminescence and transmittance) at PLA was realized to optimize efficiently PLA conditions. The changes in optical properties were related to structural, microstructural, and surface properties characterized by X-ray diffraction (XRD)and atomic force microscopy (AFM). The substantial increase of Eu3+ emission was observed for all annealed materials. PLA induces crystallization of TiO2 and Lu2O3 amorphous matrix, while in the case of already nanocrystalline ZnO, rather surface smoothening related grains’ coalescence was observed.

Název v anglickém jazyce

In situ monitoring of pulsed laser annealing of Eu-doped oxide thin films

Popis výsledku anglicky

Eu3+ doped oxide thin films possess a great potential for several emerging applications in optics, optoelectronics, and sensors. The applications demand maximizing Eu3+ photoluminescence response. Eu-doped ZnO, TiO2, and Lu2O3 thin films were deposited by Pulsed Laser Deposition (PLD). Pulsed UV Laser Annealing (PLA) was utilized to modify the properties of the films. In situ monitoring of the evolution of optical properties photoluminescence and transmittance) at PLA was realized to optimize efficiently PLA conditions. The changes in optical properties were related to structural, microstructural, and surface properties characterized by X-ray diffraction (XRD)and atomic force microscopy (AFM). The substantial increase of Eu3+ emission was observed for all annealed materials. PLA induces crystallization of TiO2 and Lu2O3 amorphous matrix, while in the case of already nanocrystalline ZnO, rather surface smoothening related grains’ coalescence was observed.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20506 - Coating and films

Projekt

<a href="/cs/project/GA18-17834S" target="_blank" >GA18-17834S: Pokročilý in-situ monitoring strukturních změn opticky aktivních materiálů během laserového žíhání</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Materials

ISSN

1996-1944

e-ISSN

1996-1944

Svazek periodika

14

Číslo periodika v rámci svazku

24

Stát vydavatele periodika

CH - Švýcarská konfederace

Počet stran výsledku

13

Strana od-do

7576

Kód UT WoS článku

000738384800001

EID výsledku v databázi Scopus

2-s2.0-85121326735