Below the urbach edge: solar cell loss analysis based on full external quantum efficiency spectra

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F23%3A00574647" target="_blank" >RIV/68378271:_____/23:00574647 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21230/23:00367099 RIV/00216208:11320/23:10472957

Výsledek na webu

<a href="https://hdl.handle.net/11104/0346917" target="_blank" >https://hdl.handle.net/11104/0346917</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acsenergylett.3c00951" target="_blank" >10.1021/acsenergylett.3c00951</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Below the urbach edge: solar cell loss analysis based on full external quantum efficiency spectra

Popis výsledku v původním jazyce

We suggest a new solar cell loss analysis by using the external quantum efficiency (EQE) measured with sufficiently high sensitivity to also account for defects. Unlike common radiative-limit methods, where the impact of deep defects is ignored by exponential extrapolation of the Urbach absorption edge, our loss analysis considers the full EQE including states below the Urbach edge and uses corrections for band-filling and light trapping. We validate this new metric on a whole range of photovoltaic materials and verify its accuracy by electrical simulations. Any deviations between this newly established metric and experimental open circuit voltage are due to the presence of spatially localized defects and are explained as violations of the assumption of flat quasi-Fermi levels through the device.

Název v anglickém jazyce

Below the urbach edge: solar cell loss analysis based on full external quantum efficiency spectra

Popis výsledku anglicky

We suggest a new solar cell loss analysis by using the external quantum efficiency (EQE) measured with sufficiently high sensitivity to also account for defects. Unlike common radiative-limit methods, where the impact of deep defects is ignored by exponential extrapolation of the Urbach absorption edge, our loss analysis considers the full EQE including states below the Urbach edge and uses corrections for band-filling and light trapping. We validate this new metric on a whole range of photovoltaic materials and verify its accuracy by electrical simulations. Any deviations between this newly established metric and experimental open circuit voltage are due to the presence of spatially localized defects and are explained as violations of the assumption of flat quasi-Fermi levels through the device.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

ACS ENERGY LETTERS

ISSN

2380-8195

e-ISSN

2380-8195

Svazek periodika

8

Číslo periodika v rámci svazku

7

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

7

Strana od-do

3221-3227

Kód UT WoS článku

001021459800001

EID výsledku v databázi Scopus

2-s2.0-85164932646