Damage detection in thin films using second harmonic generation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F24%3A00605288" target="_blank" >RIV/68378271:_____/24:00605288 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/61389021:_____/24:00605288

Výsledek na webu

<a href="https://www.spiedigitallibrary.org/conference-proceedings-of-spie/13020/3017415/Damage-detection-in-thin-films-using-second-harmonic-generation/10.1117/12.3017415.short" target="_blank" >https://www.spiedigitallibrary.org/conference-proceedings-of-spie/13020/3017415/Damage-detection-in-thin-films-using-second-harmonic-generation/10.1117/12.3017415.short</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.3017415" target="_blank" >10.1117/12.3017415</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Damage detection in thin films using second harmonic generation

Popis výsledku v původním jazyce

The laser-induced damage threshold (LIDT) is a commonly used method for testing optical thin films, where the sample is exposed to laser radiation of a defined intensity and observed for laser-induced damage. Sensitive evaluation of the damage is essential for the experiment and different approaches are used for this purpose. This work introduces a new approach to LIDT evaluation based on the second harmonic generation (SHG) principle for the detection of defects in thin films. The process of SHG is very sensitive to changes in the symmetry of the crystal lattice of the material, which can be very well exploited for the observation of defects and various changes in thin films. We developed a setup able to track the polarization-dependent SHG from the samples with micrometer resolution for a broad range of incident angles in both reflection and transmission regimes. We use this setup to study the polarization and angular dependence of SHG in pristine and irradiation-affected areas on various thin films (Si3N4, TiO2,...). Our measurements show that SHG makes it possible to reliably detect spots with subtle laser-induced changes in the material that are hardly detectable or even undetectable by scanning electron microscopy or other commonly used methods.

Název v anglickém jazyce

Damage detection in thin films using second harmonic generation

Popis výsledku anglicky

The laser-induced damage threshold (LIDT) is a commonly used method for testing optical thin films, where the sample is exposed to laser radiation of a defined intensity and observed for laser-induced damage. Sensitive evaluation of the damage is essential for the experiment and different approaches are used for this purpose. This work introduces a new approach to LIDT evaluation based on the second harmonic generation (SHG) principle for the detection of defects in thin films. The process of SHG is very sensitive to changes in the symmetry of the crystal lattice of the material, which can be very well exploited for the observation of defects and various changes in thin films. We developed a setup able to track the polarization-dependent SHG from the samples with micrometer resolution for a broad range of incident angles in both reflection and transmission regimes. We use this setup to study the polarization and angular dependence of SHG in pristine and irradiation-affected areas on various thin films (Si3N4, TiO2,...). Our measurements show that SHG makes it possible to reliably detect spots with subtle laser-induced changes in the material that are hardly detectable or even undetectable by scanning electron microscopy or other commonly used methods.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

Výsledek vznikl pri realizaci vícero projektů. Více informací v záložce Projekty.

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2024

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of SPIE - The International Society for Optical Engineering

ISBN

978-1-5106-7359-5

ISSN

—

e-ISSN

—

Počet stran výsledku

3

Strana od-do

130200F

Název nakladatele

The International Society for Optical Engineering

Místo vydání

Bellingham

Místo konání akce

Strasbourg

Datum konání akce

8. 4. 2024

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

001281497200014