Surface-tension-induced phase transitions in freestanding ferroelectric thin films

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00639091" target="_blank" >RIV/68378271:_____/25:00639091 - isvavai.cz</a>

Výsledek na webu

<a href="https://hdl.handle.net/11104/0369630" target="_blank" >https://hdl.handle.net/11104/0369630</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1021/acs.nanolett.5c03216" target="_blank" >10.1021/acs.nanolett.5c03216</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Surface-tension-induced phase transitions in freestanding ferroelectric thin films

Popis výsledku v původním jazyce

The control of ferroelectric topological phases in ultrathin films is central to the development of next-generation nanoelectronic devices. While epitaxial strain is widely used to tune polarization states, its applicability is inherently limited to substrate-bound systems. Here, we show that surface tension becomes a key mechanical factor in freestanding ferroelectric films, governing phase stability and the emergence of topological polarization textures. Using a thermodynamic free energy framework, we show that surface tension induces effective compressive stress in freestanding films, strongly influencing both uniform and topological polarization states. Surface tension also drives large-scale morphological instabilities, reshaping phase behavior in the ferroelectric regime. Our results reveal surface tension as a robust, substrate-independent mechanism for engineering polarization states in freestanding films, creating new opportunities for flexible, strain-free ferroelectric devices.

Název v anglickém jazyce

Surface-tension-induced phase transitions in freestanding ferroelectric thin films

Popis výsledku anglicky

The control of ferroelectric topological phases in ultrathin films is central to the development of next-generation nanoelectronic devices. While epitaxial strain is widely used to tune polarization states, its applicability is inherently limited to substrate-bound systems. Here, we show that surface tension becomes a key mechanical factor in freestanding ferroelectric films, governing phase stability and the emergence of topological polarization textures. Using a thermodynamic free energy framework, we show that surface tension induces effective compressive stress in freestanding films, strongly influencing both uniform and topological polarization states. Surface tension also drives large-scale morphological instabilities, reshaping phase behavior in the ferroelectric regime. Our results reveal surface tension as a robust, substrate-independent mechanism for engineering polarization states in freestanding films, creating new opportunities for flexible, strain-free ferroelectric devices.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nano Letters

ISSN

1530-6984

e-ISSN

1530-6992

Svazek periodika

25

Číslo periodika v rámci svazku

34

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

8

Strana od-do

12987-12994

Kód UT WoS článku

001550191000001

EID výsledku v databázi Scopus

2-s2.0-105014229448