Surface and bulk leakage current in Trench-Isolated LGADs: implications for self-induced ghost signal

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68378271%3A_____%2F25%3A00639912" target="_blank" >RIV/68378271:_____/25:00639912 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1088/1748-0221/20/10/C10006" target="_blank" >https://doi.org/10.1088/1748-0221/20/10/C10006</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/20/10/C10006" target="_blank" >10.1088/1748-0221/20/10/C10006</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Surface and bulk leakage current in Trench-Isolated LGADs: implications for self-induced ghost signal

Popis výsledku v původním jazyce

The research presented in this paper addresses several advanced and interconnected concepts in silicon detector physics, particularly bulk type inversion, guard ring (GR) leakage, and the distinction between surface and bulk leakage currents in the presence of defects and isolation structures but in absence of edge field termination structure (JTE). By studying the leakage current behavior, we explored the mechanisms behind self-induced signals, referred to as ghosts, in Trench-Isolated Low Gain Avalanche Diodes (Ti-LGADs). These ghost signals are enhanced when the innermost guard ring is left floating but are suppressed (or reduced below detectable levels) when the GR is biased to the same potential as the readout pad. This observation motivated a more systematic investigation of leakage current, aiming to disentangle the residual leakage contributions from the pad leakage in both irradiated and non-irradiated Ti-LGADs, fabricated within the RD50 and AIDAInnova productions at FBK, Trento. Our findings contribute to the ongoing R&D of radiation-tolerant Ti-LGADs for 4D tracking applications in future accelerator experiments.

Název v anglickém jazyce

Surface and bulk leakage current in Trench-Isolated LGADs: implications for self-induced ghost signal

Popis výsledku anglicky

The research presented in this paper addresses several advanced and interconnected concepts in silicon detector physics, particularly bulk type inversion, guard ring (GR) leakage, and the distinction between surface and bulk leakage currents in the presence of defects and isolation structures but in absence of edge field termination structure (JTE). By studying the leakage current behavior, we explored the mechanisms behind self-induced signals, referred to as ghosts, in Trench-Isolated Low Gain Avalanche Diodes (Ti-LGADs). These ghost signals are enhanced when the innermost guard ring is left floating but are suppressed (or reduced below detectable levels) when the GR is biased to the same potential as the readout pad. This observation motivated a more systematic investigation of leakage current, aiming to disentangle the residual leakage contributions from the pad leakage in both irradiated and non-irradiated Ti-LGADs, fabricated within the RD50 and AIDAInnova productions at FBK, Trento. Our findings contribute to the ongoing R&D of radiation-tolerant Ti-LGADs for 4D tracking applications in future accelerator experiments.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10303 - Particles and field physics

Projekt

<a href="/cs/project/LM2023040" target="_blank" >LM2023040: Výzkumná infrastruktura pro experimenty v CERN</a><br>

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Instrumentation

ISSN

1748-0221

e-ISSN

1748-0221

Svazek periodika

20

Číslo periodika v rámci svazku

10

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

10

Strana od-do

C10006

Kód UT WoS článku

001589123100001

EID výsledku v databázi Scopus

2-s2.0-105017841829