Modern Optoelectronic Methods for Non-Contact Deformation Measurement in Industry

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21110%2F02%3A01077781" target="_blank" >RIV/68407700:21110/02:01077781 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Modern Optoelectronic Methods for Non-Contact Deformation Measurement in Industry

Popis výsledku v původním jazyce

Two different types of optoelectronic method for non-contact deformation measurement are described: the ray method and the interferometric method. The work is focused on several theoretical and experimental aspects of evaluation of the deformations withthe ray method, especially on problems of measuring extended objects in engineering practice and automatic processes for evaluation of deformations. We also propose a technique for the smoothing of continuous optically rough surfaces to allow successfulapplication of the ray method for deformation measurement. In this work we describe a proposed optical method for measuring static deformations based on the interference of coherent wave fields and a phase shifting procedure. Detailed analysis of the measurement and evaluation process with respect to the most important measurement factors is performed

Název v anglickém jazyce

Modern Optoelectronic Methods for Non-Contact Deformation Measurement in Industry

Popis výsledku anglicky

Two different types of optoelectronic method for non-contact deformation measurement are described: the ray method and the interferometric method. The work is focused on several theoretical and experimental aspects of evaluation of the deformations withthe ray method, especially on problems of measuring extended objects in engineering practice and automatic processes for evaluation of deformations. We also propose a technique for the smoothing of continuous optically rough surfaces to allow successfulapplication of the ray method for deformation measurement. In this work we describe a proposed optical method for measuring static deformations based on the interference of coherent wave fields and a phase shifting procedure. Detailed analysis of the measurement and evaluation process with respect to the most important measurement factors is performed

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

<a href="/cs/project/GA103%2F02%2F0357" target="_blank" >GA103/02/0357: Moderní optoelektronické metody topografie ploch</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2002

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Optics A: Pure and Applied Optics

ISSN

1464-4258

e-ISSN

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Svazek periodika

4

Číslo periodika v rámci svazku

6

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

8

Strana od-do

413-420

Kód UT WoS článku

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EID výsledku v databázi Scopus

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