Comparison of Optical Scanners for Reverse Engineering Applications on Glossy Freeform Artifact Pharaoh
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21220%2F25%3A00384997" target="_blank" >RIV/68407700:21220/25:00384997 - isvavai.cz</a>
Výsledek na webu
<a href="https://doi.org/10.21062/mft.2025.015" target="_blank" >https://doi.org/10.21062/mft.2025.015</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.21062/mft.2025.015" target="_blank" >10.21062/mft.2025.015</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
Comparison of Optical Scanners for Reverse Engineering Applications on Glossy Freeform Artifact Pharaoh
Popis výsledku v původním jazyce
Article deals with analysis on influence of post-process settings profiles in the Polyworks software and its influence on measuring bias (difference between average surface profile deviation and artifacts reference value) and standard deviation of measured data. The comparison was evaluated on glossy artifact with freeform surfaces. Setting with least bias and standard deviation was than used to evaluate repeatability and systematic measurement error and minimum tolerance bandwidth Tmin according to VDA 5 and MSA 4, respectively for three conceptions of laser scanning technologies available on today's market. Cartesian CMM LK Altera S with laser scanner Nikon LC15Dx (automated technology), Measuring arm Nikon MCAx S30 with laser scanner Nikon H120 (manual technology) and optically tracked handheld device Metronor M-Scan with laser scanner Nikon H120 (manual technology). The conclusions of the study can serve as a guide in technology selection for reverse engineering input data acquisition. Subsequently, the optimal parameters of the post-process settings (for glossy surfaces) in the Polyworks software are listed.
Název v anglickém jazyce
Comparison of Optical Scanners for Reverse Engineering Applications on Glossy Freeform Artifact Pharaoh
Popis výsledku anglicky
Article deals with analysis on influence of post-process settings profiles in the Polyworks software and its influence on measuring bias (difference between average surface profile deviation and artifacts reference value) and standard deviation of measured data. The comparison was evaluated on glossy artifact with freeform surfaces. Setting with least bias and standard deviation was than used to evaluate repeatability and systematic measurement error and minimum tolerance bandwidth Tmin according to VDA 5 and MSA 4, respectively for three conceptions of laser scanning technologies available on today's market. Cartesian CMM LK Altera S with laser scanner Nikon LC15Dx (automated technology), Measuring arm Nikon MCAx S30 with laser scanner Nikon H120 (manual technology) and optically tracked handheld device Metronor M-Scan with laser scanner Nikon H120 (manual technology). The conclusions of the study can serve as a guide in technology selection for reverse engineering input data acquisition. Subsequently, the optimal parameters of the post-process settings (for glossy surfaces) in the Polyworks software are listed.
Klasifikace
Druh
J<sub>imp</sub> - Článek v periodiku v databázi Web of Science
CEP obor
—
OECD FORD obor
20301 - Mechanical engineering
Návaznosti výsledku
Projekt
—
Návaznosti
S - Specificky vyzkum na vysokych skolach
Ostatní
Rok uplatnění
2025
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
Manufacturing Technology
ISSN
1213-2489
e-ISSN
2787-9402
Svazek periodika
25
Číslo periodika v rámci svazku
1
Stát vydavatele periodika
CZ - Česká republika
Počet stran výsledku
12
Strana od-do
45-56
Kód UT WoS článku
001484847600005
EID výsledku v databázi Scopus
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