Various Scale Errors in Dithered Quantizers. Visualisation and Reduction

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F00%3A03022397" target="_blank" >RIV/68407700:21230/00:03022397 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Various Scale Errors in Dithered Quantizers. Visualisation and Reduction

Popis výsledku v původním jazyce

Dithering is being used for elimination quantization error and other small scale errors of AD converters. However, large scale error remain. It is possible to reduce these errors by the look-up table or by subtracting a suitable approximation. Sub-quantum accuracy can be achieved. The prediction of metrological reliability of the dithered AD converter cannot be simply made. It is necessary to separate errors of various scales of the used AD converter. The multiscale approach has been used for several years for characterization of complex signals. One of the multiscale analysis methods, the Continuous Wavelet Transform (CWT), makes it possible to find out at which scale and position the particular phenomenon occured.

Název v anglickém jazyce

Various Scale Errors in Dithered Quantizers. Visualisation and Reduction

Popis výsledku anglicky

Dithering is being used for elimination quantization error and other small scale errors of AD converters. However, large scale error remain. It is possible to reduce these errors by the look-up table or by subtracting a suitable approximation. Sub-quantum accuracy can be achieved. The prediction of metrological reliability of the dithered AD converter cannot be simply made. It is necessary to separate errors of various scales of the used AD converter. The multiscale approach has been used for several years for characterization of complex signals. One of the multiscale analysis methods, the Continuous Wavelet Transform (CWT), makes it possible to find out at which scale and position the particular phenomenon occured.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2000

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Measurement

ISSN

0263-2241

e-ISSN

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Svazek periodika

28

Číslo periodika v rámci svazku

28

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

7

Strana od-do

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Kód UT WoS článku

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EID výsledku v databázi Scopus

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