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Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F04%3A03099817" target="_blank" >RIV/68407700:21230/04:03099817 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Measurement of RMS Values of Non-coherently Sampled Signals

Popis výsledku v původním jazyce

If the RMS value is gained by digital processing of sequence of signal samples, both uncertainty and bias of the measured value depend on the algorithm used. Since in practice signal sampling is usually non-coherent, leakage occurs in signal DFT spectrumand definition of the RMS of periodic signals in time domain is violated. The paper compares three different DSP algorithms of RMS measurement by non-coherent sampling from the point of view of measurement bias and uncertainty for different algorithms and various leakage levels, ADC resolution, additive noise and data window used. Results of simulations and some measurements are evaluated both for monofrequency and multifrequency signals, and a new method of automatic RMS value bias correction will bepresented. Processing of digitized signal samples in time domain with two methods of signal processing in frequency domain are compared for the case of pure sinusoidal signals, and sinusoidal signal with additive noise.

Název v anglickém jazyce

Measurement of RMS Values of Non-coherently Sampled Signals

Popis výsledku anglicky

If the RMS value is gained by digital processing of sequence of signal samples, both uncertainty and bias of the measured value depend on the algorithm used. Since in practice signal sampling is usually non-coherent, leakage occurs in signal DFT spectrumand definition of the RMS of periodic signals in time domain is violated. The paper compares three different DSP algorithms of RMS measurement by non-coherent sampling from the point of view of measurement bias and uncertainty for different algorithms and various leakage levels, ADC resolution, additive noise and data window used. Results of simulations and some measurements are evaluated both for monofrequency and multifrequency signals, and a new method of automatic RMS value bias correction will bepresented. Processing of digitized signal samples in time domain with two methods of signal processing in frequency domain are compared for the case of pure sinusoidal signals, and sinusoidal signal with additive noise.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2004

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

13th International Symposium on Measurements for Research and Industry Applications

ISBN

960-254-643-3

ISSN

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e-ISSN

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Počet stran výsledku

6

Strana od-do

230-235

Název nakladatele

IMEKO TC-4

Místo vydání

Athens

Místo konání akce

Athens

Datum konání akce

29. 9. 2004

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

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