Measurement of Extreme Impedances

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F10%3A00167965" target="_blank" >RIV/68407700:21230/10:00167965 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Measurement of Extreme Impedances

Popis výsledku v původním jazyce

This paper provides an experimental verification of a novel method for measurement of extreme impedances which was theoretically described earlier. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in the earlier paper are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 k? up to 330 k?. Anovel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values.

Název v anglickém jazyce

Measurement of Extreme Impedances

Popis výsledku anglicky

This paper provides an experimental verification of a novel method for measurement of extreme impedances which was theoretically described earlier. In this paper experiments proving that the method can significantly improve stability of a measurement system are described. Using Agilent PNA E8364A vector network analyzer the method is able to measure reflection coefficient with stability improved 36-times in magnitude and 354-times in phase compared to the classical method of reflection coefficient measurement. Further, validity of the error model and related equations stated in the earlier paper are verified by real measurement of SMD resistors (size 0603) in microwave test fixture. Values of the measured SMD resistors range from 12 k? up to 330 k?. Anovel calibration technique using three different resistors as calibration standards is used. The measured values of impedances reasonably agree with assumed values.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

<a href="/cs/project/GD102%2F08%2FH027" target="_blank" >GD102/08/H027: Pokročilé metody, struktury a komponenty elektronické bezdrátové komunikace</a><br>

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proceedings of 15th Conference on Microwave Techniques COMITE 2010

ISBN

978-1-4244-6351-0

ISSN

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e-ISSN

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Počet stran výsledku

4

Strana od-do

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Název nakladatele

VUT v Brně, FEKT, Ústav radioelektroniky

Místo vydání

Brno

Místo konání akce

Brno

Datum konání akce

19. 4. 2010

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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