Effect of Climatic Cycling on Reliability of Electrically Conductive Adhesives

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Effect of Climatic Cycling on Reliability of Electrically Conductive Adhesives

Popis výsledku v původním jazyce

In this paper the results of experiments with climatic cycles are presented. Accelerated reliability tests have been focused on aspects of the assembly process on PCB using one-component and two-component ECAs. The aim of experiments was the specification of potential reliability risks of using ECAs in an environment with climatic cycles. According to our measurements, ECAS are generally highly sensitive to climatic cycles. The least dangerous type of cyclic loading is a cycle moist heat - dry heat. During temperature cycles and cycles moist heat - low temperature, structural changes of joints made with one-component adhesive AX 20 were observed. In both cases, cracks were optically detected. Although the change of electrical resistance measured on AX20 adhesive joints was relatively small (6%), temperature cycling provoked creation of cracks in all the joints.

Název v anglickém jazyce

Effect of Climatic Cycling on Reliability of Electrically Conductive Adhesives

Popis výsledku anglicky

In this paper the results of experiments with climatic cycles are presented. Accelerated reliability tests have been focused on aspects of the assembly process on PCB using one-component and two-component ECAs. The aim of experiments was the specification of potential reliability risks of using ECAs in an environment with climatic cycles. According to our measurements, ECAS are generally highly sensitive to climatic cycles. The least dangerous type of cyclic loading is a cycle moist heat - dry heat. During temperature cycles and cycles moist heat - low temperature, structural changes of joints made with one-component adhesive AX 20 were observed. In both cases, cracks were optically detected. Although the change of electrical resistance measured on AX20 adhesive joints was relatively small (6%), temperature cycling provoked creation of cracks in all the joints.

Druh

D - Stať ve sborníku

CEP obor

JA - Elektronika a optoelektronika, elektrotechnika

OECD FORD obor

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Projekt

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Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2010

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

POSTER 2010 - Proceedings of the 14th International Conference on Electrical Engineering

ISBN

978-80-01-04544-2

ISSN

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e-ISSN

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Počet stran výsledku

5

Strana od-do

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Název nakladatele

ČVUT, Fakulta elektrotechnická

Místo vydání

Praha

Místo konání akce

Praha

Datum konání akce

6. 5. 2010

Typ akce podle státní příslušnosti

EUR - Evropská akce

Kód UT WoS článku

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