A Mode-Matching Technique for Analysis of Scattering by Periodic Comb Surfaces
Identifikátory výsledku
Kód výsledku v IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F15%3A00231316" target="_blank" >RIV/68407700:21230/15:00231316 - isvavai.cz</a>
Výsledek na webu
<a href="http://dx.doi.org/10.1109/TAP.2015.2452945" target="_blank" >http://dx.doi.org/10.1109/TAP.2015.2452945</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1109/TAP.2015.2452945" target="_blank" >10.1109/TAP.2015.2452945</a>
Alternativní jazyky
Jazyk výsledku
angličtina
Název v původním jazyce
A Mode-Matching Technique for Analysis of Scattering by Periodic Comb Surfaces
Popis výsledku v původním jazyce
Numerical techniques for calculating electromagnetic fields within three-dimensional surfaces are computationally intensive. Therefore, this paper presents the application of a modematching technique developed for analyzing electromagnetic scattering from periodic comb surfaces illuminated by a plane wave. A set of linear equations has been developed to calculate mode coefficients of the field distribution for both E- and H-polarized incident waves. Analysis is performed for two cases where the comb thickness is either infinitely thin or of a finite thickness. The technique is shown to accurately predict both field intensities within the near-field of the periodic surface and far-field scattering patterns. Results are compared to those obtained using the finite integration techniques (FIT) implemented in CST Microwave Studio. Furthermore, numerical results are compared to measurements of an aluminum prototype. Additional far-field scattering measurements using a bi-static system provid
Název v anglickém jazyce
A Mode-Matching Technique for Analysis of Scattering by Periodic Comb Surfaces
Popis výsledku anglicky
Numerical techniques for calculating electromagnetic fields within three-dimensional surfaces are computationally intensive. Therefore, this paper presents the application of a modematching technique developed for analyzing electromagnetic scattering from periodic comb surfaces illuminated by a plane wave. A set of linear equations has been developed to calculate mode coefficients of the field distribution for both E- and H-polarized incident waves. Analysis is performed for two cases where the comb thickness is either infinitely thin or of a finite thickness. The technique is shown to accurately predict both field intensities within the near-field of the periodic surface and far-field scattering patterns. Results are compared to those obtained using the finite integration techniques (FIT) implemented in CST Microwave Studio. Furthermore, numerical results are compared to measurements of an aluminum prototype. Additional far-field scattering measurements using a bi-static system provid
Klasifikace
Druh
J<sub>x</sub> - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
CEP obor
JA - Elektronika a optoelektronika, elektrotechnika
OECD FORD obor
—
Návaznosti výsledku
Projekt
—
Návaznosti
R - Projekt Ramcoveho programu EK
Ostatní
Rok uplatnění
2015
Kód důvěrnosti údajů
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Údaje specifické pro druh výsledku
Název periodika
IEEE Transactions on Antennas and Propagation
ISSN
0018-926X
e-ISSN
—
Svazek periodika
63
Číslo periodika v rámci svazku
9
Stát vydavatele periodika
US - Spojené státy americké
Počet stran výsledku
8
Strana od-do
4016-4023
Kód UT WoS článku
000360803400024
EID výsledku v databázi Scopus
2-s2.0-84940973050