Detailed Analysis of Multi-Mode Optical Components for Utilization in Data Centers

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F17%3A00319991" target="_blank" >RIV/68407700:21230/17:00319991 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Detailed Analysis of Multi-Mode Optical Components for Utilization in Data Centers

Popis výsledku v původním jazyce

Due to the high demands for the reliability of data centers, the determination of properly excited optical field inside the multimode (MM) fiber core belongs to the key parameters while designing such a MM optical system architecture for data centers. Appropriately excited mode field of the MM fiber provides optimal power budget in connections, leads to the decrease of insertion losses (IL) and achieves effective modal bandwidth (EMB), which is essential for high data rates. Crucial is especially the encircled flux (EF) parameter, which should be properly defined for combinations of variable optical sources and MM fiber infrastructure to provide proper mode-field distribution. In this paper, we present detailed investigation and measurements of the mode field distribution for short MM optical data center links with the emphasis on their reliability. Such characterization is essential for the design of large MM networks. Various scenarios were tested in terms of IL and mode-field distribution to reveal potential problematic scenarios. Furthermore, we focused via simulations and experiments on the estimation of particular defects and errors, which can realistically occur like eccentricity or connector misalignment. Their dependence on EF statistics and functionality of data center infrastructure was evaluated. Finally, we provide recommendations for data center systems and networks, using OM3 MM fiber connections

Název v anglickém jazyce

Detailed Analysis of Multi-Mode Optical Components for Utilization in Data Centers

Popis výsledku anglicky

Due to the high demands for the reliability of data centers, the determination of properly excited optical field inside the multimode (MM) fiber core belongs to the key parameters while designing such a MM optical system architecture for data centers. Appropriately excited mode field of the MM fiber provides optimal power budget in connections, leads to the decrease of insertion losses (IL) and achieves effective modal bandwidth (EMB), which is essential for high data rates. Crucial is especially the encircled flux (EF) parameter, which should be properly defined for combinations of variable optical sources and MM fiber infrastructure to provide proper mode-field distribution. In this paper, we present detailed investigation and measurements of the mode field distribution for short MM optical data center links with the emphasis on their reliability. Such characterization is essential for the design of large MM networks. Various scenarios were tested in terms of IL and mode-field distribution to reveal potential problematic scenarios. Furthermore, we focused via simulations and experiments on the estimation of particular defects and errors, which can realistically occur like eccentricity or connector misalignment. Their dependence on EF statistics and functionality of data center infrastructure was evaluated. Finally, we provide recommendations for data center systems and networks, using OM3 MM fiber connections

Druh

D - Stať ve sborníku

CEP obor

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OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/FV10519" target="_blank" >FV10519: Analyzátor vidové struktury optických komponent</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2017

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Global Information Infrastructure and Networking Symposium

ISBN

978-1-5090-4934-9

ISSN

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e-ISSN

2150-329X

Počet stran výsledku

5

Strana od-do

45-49

Název nakladatele

IEEE (Institute of Electrical and Electronics Engineers)

Místo vydání

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Místo konání akce

Saint Pierre

Datum konání akce

25. 10. 2017

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

000426609000007