Characterisation of X-ray mirrors based on chromium-iridium tri-layer coatings

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F21%3A00355312" target="_blank" >RIV/68407700:21230/21:00355312 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1117/12.2592551" target="_blank" >https://doi.org/10.1117/12.2592551</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1117/12.2592551" target="_blank" >10.1117/12.2592551</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Characterisation of X-ray mirrors based on chromium-iridium tri-layer coatings

Popis výsledku v původním jazyce

Iridium-based layer systems are highly effective mirror coatings for space-born X-ray telescopes. During the recent years, Aschaffenburg University of Applied Sciences and its partners developed stress compensated chromium-iridium coatings for such astronomical applications, using chromium as an adhesive layer between iridium reflective layer and mirror substrate. However, there was room for improvement: To overcome the disturbing reflectivity reduction of the iridium absorption edge around 2 keV photon energy, thin overcoat layers of chromium are applied in addition now. This layer system has been analyzed by atomic force microscopy and transmission electron microscopy images. Furthermore, the reflectivity of such innovative X-ray mirrors based on chromium-iridium tri-layer coatings was recently measured at PTB's four-crystal monochromator beamline at the synchrotron radiation facility BESSY II. The experimental results, obtained for photon energies between 1.9 keV and 11 keV at two grazing incidence angles (0.6 degree and 0.9 degree) and their comparison with corresponding simulations are presented in this contribution. When compared to simulations of pure iridium coatings, a significantly higher reflectivity was achieved especially in the soft X-ray regime between 2 keV and 4 keV. Such chromium-iridium tri-layer coatings have high potential to increase the effective area for X-ray telescopes in Lobster Eye Design, for Wolter-I type X-ray optics, and for silicon pore optics as considered for the ATHENA telescope of the European Space Agency.

Název v anglickém jazyce

Characterisation of X-ray mirrors based on chromium-iridium tri-layer coatings

Popis výsledku anglicky

Iridium-based layer systems are highly effective mirror coatings for space-born X-ray telescopes. During the recent years, Aschaffenburg University of Applied Sciences and its partners developed stress compensated chromium-iridium coatings for such astronomical applications, using chromium as an adhesive layer between iridium reflective layer and mirror substrate. However, there was room for improvement: To overcome the disturbing reflectivity reduction of the iridium absorption edge around 2 keV photon energy, thin overcoat layers of chromium are applied in addition now. This layer system has been analyzed by atomic force microscopy and transmission electron microscopy images. Furthermore, the reflectivity of such innovative X-ray mirrors based on chromium-iridium tri-layer coatings was recently measured at PTB's four-crystal monochromator beamline at the synchrotron radiation facility BESSY II. The experimental results, obtained for photon energies between 1.9 keV and 11 keV at two grazing incidence angles (0.6 degree and 0.9 degree) and their comparison with corresponding simulations are presented in this contribution. When compared to simulations of pure iridium coatings, a significantly higher reflectivity was achieved especially in the soft X-ray regime between 2 keV and 4 keV. Such chromium-iridium tri-layer coatings have high potential to increase the effective area for X-ray telescopes in Lobster Eye Design, for Wolter-I type X-ray optics, and for silicon pore optics as considered for the ATHENA telescope of the European Space Agency.

Druh

D - Stať ve sborníku

CEP obor

—

OECD FORD obor

20506 - Coating and films

Projekt

—

Návaznosti

R - Projekt Ramcoveho programu EK

Rok uplatnění

2021

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název statě ve sborníku

Proc. SPIE 11776, EUV and X-ray Optics, Sources, and Instrumentation

ISBN

978-1-5106-4386-4

ISSN

0277-786X

e-ISSN

1996-756X

Počet stran výsledku

8

Strana od-do

—

Název nakladatele

The International Society for Optical Engineering (SPIE)

Místo vydání

Bellingham WA

Místo konání akce

Praha

Datum konání akce

19. 4. 2021

Typ akce podle státní příslušnosti

WRD - Celosvětová akce

Kód UT WoS článku

—