Characterization of 3.2 Gbps readout in 65 nm CMOS technology

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21230%2F23%3A00365927" target="_blank" >RIV/68407700:21230/23:00365927 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21340/23:00365927

Výsledek na webu

<a href="https://doi.org/10.1088/1748-0221/18/01/C01055" target="_blank" >https://doi.org/10.1088/1748-0221/18/01/C01055</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/18/01/C01055" target="_blank" >10.1088/1748-0221/18/01/C01055</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Characterization of 3.2 Gbps readout in 65 nm CMOS technology

Popis výsledku v původním jazyce

A new class of photon-counting pixel detectors allows for capturing of an image in several photon energy bins in one shot. A decreased pixel pitch and an increased number of energy bins are needed to enhance the spatial and spectral resolution of the detector. This led to new requirements for the readout systems and their bandwidths, as more data is generated for the same detection area. Fast differential serial communication enables high-speed data rates, thus providing an ideal solution to transfer large amounts of data generated by the detector's front-end electronics. However, its implementation provides extra challenges. This work introduces a novel high-speed serial readout designed in a 65 nm CMOS technology that will be used in the future photon-counting X-ray imaging detectors. The design of the serial transmitter is presented together with the characterization of jitter and channel performance.

Název v anglickém jazyce

Characterization of 3.2 Gbps readout in 65 nm CMOS technology

Popis výsledku anglicky

A new class of photon-counting pixel detectors allows for capturing of an image in several photon energy bins in one shot. A decreased pixel pitch and an increased number of energy bins are needed to enhance the spatial and spectral resolution of the detector. This led to new requirements for the readout systems and their bandwidths, as more data is generated for the same detection area. Fast differential serial communication enables high-speed data rates, thus providing an ideal solution to transfer large amounts of data generated by the detector's front-end electronics. However, its implementation provides extra challenges. This work introduces a novel high-speed serial readout designed in a 65 nm CMOS technology that will be used in the future photon-counting X-ray imaging detectors. The design of the serial transmitter is presented together with the characterization of jitter and channel performance.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

20201 - Electrical and electronic engineering

Projekt

<a href="/cs/project/EF16_019%2F0000778" target="_blank" >EF16_019/0000778: Centrum pokročilých aplikovaných přírodních věd</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2023

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Instrumentation

ISSN

1748-0221

e-ISSN

1748-0221

Svazek periodika

18

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

7

Strana od-do

—

Kód UT WoS článku

000948372200011

EID výsledku v databázi Scopus

2-s2.0-85147138962