Reflectivity measurement inside small hollow mirrors using an x-ray tube

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F11%3A00181216" target="_blank" >RIV/68407700:21340/11:00181216 - isvavai.cz</a>

Výsledek na webu

<a href="http://stacks.iop.org/1402-4896/84/015404" target="_blank" >http://stacks.iop.org/1402-4896/84/015404</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/0031-8949/84/01/015404" target="_blank" >10.1088/0031-8949/84/01/015404</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Reflectivity measurement inside small hollow mirrors using an x-ray tube

Popis výsledku v původním jazyce

Small hollow x-ray mirrors are manufactured by several techniques. The mirror material-the reflecting surface itself-can be either a simple metal, such as Au or Ni, or a multilayer. The development of a manufacturing technique, however, requires a simpleway of measuring the mirror reflectivity curves. This may be done using a pencil beam at the synchrotron, but it is rather difficult to make it in a laboratory using an x-ray tube. This paper describes the development of a method of carrying out absolute reflectivity measurements inside these mirrors using only a typical laboratory source. Thus, we provide a fast, convenient and inexpensive way to perform mirror characterization. The method was tested in a laboratory and verified in synchrotron experiments in the case of conical micromirrors, while tests for other mirror shapes are under way. The method utilizes only an x-ray tube. A typical manual measurement takes approximately 1-2 h for one reflectivity curve at pr

Název v anglickém jazyce

Reflectivity measurement inside small hollow mirrors using an x-ray tube

Popis výsledku anglicky

Small hollow x-ray mirrors are manufactured by several techniques. The mirror material-the reflecting surface itself-can be either a simple metal, such as Au or Ni, or a multilayer. The development of a manufacturing technique, however, requires a simpleway of measuring the mirror reflectivity curves. This may be done using a pencil beam at the synchrotron, but it is rather difficult to make it in a laboratory using an x-ray tube. This paper describes the development of a method of carrying out absolute reflectivity measurements inside these mirrors using only a typical laboratory source. Thus, we provide a fast, convenient and inexpensive way to perform mirror characterization. The method was tested in a laboratory and verified in synchrotron experiments in the case of conical micromirrors, while tests for other mirror shapes are under way. The method utilizes only an x-ray tube. A typical manual measurement takes approximately 1-2 h for one reflectivity curve at pr

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

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Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2011

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Physica Scripta

ISSN

1402-4896

e-ISSN

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Svazek periodika

84

Číslo periodika v rámci svazku

1

Stát vydavatele periodika

GB - Spojené království Velké Británie a Severního Irska

Počet stran výsledku

8

Strana od-do

015404-015411

Kód UT WoS článku

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EID výsledku v databázi Scopus

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