Measurement of proton beam fluence by PIXE analysis of residual gas

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F12%3A00196785" target="_blank" >RIV/68407700:21340/12:00196785 - isvavai.cz</a>

Výsledek na webu

<a href="http://dx.doi.org/10.1002/xrs.2384" target="_blank" >http://dx.doi.org/10.1002/xrs.2384</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1002/xrs.2384" target="_blank" >10.1002/xrs.2384</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Measurement of proton beam fluence by PIXE analysis of residual gas

Popis výsledku v původním jazyce

Knowledge of beam fluence has a crucial role in quantitative particle-induced X-ray emission analysis. In some situations, a direct measurement of the beam charge on the target is either impossible or impractical. In such cases, indirect determination ofthe beam fluence can utilise the characteristic X-ray of argon or other gases, which was being kept at a stable low partial pressure in the vicinity of the analysed sample. As the X-ray signal of argon depends on the total charge, it can be used to quantify the charge. This paper describes the experimental design, the hardware and software modules that we created, the validation of the method, the application of the method during elemental analyses of fragile philatelic samples with overprints, and thelessons learned.

Název v anglickém jazyce

Measurement of proton beam fluence by PIXE analysis of residual gas

Popis výsledku anglicky

Knowledge of beam fluence has a crucial role in quantitative particle-induced X-ray emission analysis. In some situations, a direct measurement of the beam charge on the target is either impossible or impractical. In such cases, indirect determination ofthe beam fluence can utilise the characteristic X-ray of argon or other gases, which was being kept at a stable low partial pressure in the vicinity of the analysed sample. As the X-ray signal of argon depends on the total charge, it can be used to quantify the charge. This paper describes the experimental design, the hardware and software modules that we created, the validation of the method, the application of the method during elemental analyses of fragile philatelic samples with overprints, and thelessons learned.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

—

Návaznosti

Z - Vyzkumny zamer (s odkazem do CEZ)

Rok uplatnění

2012

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

X-Ray Spectrometry

ISSN

0049-8246

e-ISSN

—

Svazek periodika

—

Číslo periodika v rámci svazku

41

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

5

Strana od-do

235-239

Kód UT WoS článku

000305514800009

EID výsledku v databázi Scopus

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