Deconvolution of Element Depth Profiles of Self-prepared Paint Multilayers Obtained by Tabletop Confocal Micro X-ray Fluorescence Setup

Kód výsledku v IS VaVaI

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Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Deconvolution of Element Depth Profiles of Self-prepared Paint Multilayers Obtained by Tabletop Confocal Micro X-ray Fluorescence Setup

Popis výsledku v původním jazyce

Confocal micro X-ray fluorescence analysis (confocal micro-XRF) has become a significant instrumental method for investigation of a sample composition. Unlike the conventional XRF analysis, the confocal modification provides us with the depth-resolved information on the elemental distribution. By depth profiling, it is possible to distinguish individual subsequent layers in multilayered samples in a non-destructive way. However, the obtained depth profiles do not directly describe the element density profiles (the real signal). In fact, it is a convolution of the real signal (influenced by absorption) with the spectrometer sensitivity function. Direct deconvolution approach for determining the element concentration profiles in weakly absorbing matrices was derived and validated by Wrobel and Czyzycki [1]. The authors applied a deconvolution with regularization and subsequently corrected the deconvolved signals for absorption effects. This was rendered possible supposing the local densities of all elements in the individual layers were known. In our work, a slightly different deconvolution method based on a diagonal loading technique was applied to the measured element depth profiles of self-prepared paint multilayers. The confocal micro-XRF measurements were performed using a tabletop confocal micro-XRF setup designed at the Department of Dosimetry and Application of Ionizing Radiation of the Czech Technical University in Prague. The setup is equipped with polycapillary X-ray optics both in excitation and detection channel. The spectrometer sensitivity function was established by depth profiling of a thin standard foils. Deconvolution was carried out using Matlab software. Although the absorption correction has not yet been applied to the depth profiles of the measured samples, the deconvolved signals help us to determine the layer boundaries more accurately than the original depth profiles.

Název v anglickém jazyce

Deconvolution of Element Depth Profiles of Self-prepared Paint Multilayers Obtained by Tabletop Confocal Micro X-ray Fluorescence Setup

Popis výsledku anglicky

Confocal micro X-ray fluorescence analysis (confocal micro-XRF) has become a significant instrumental method for investigation of a sample composition. Unlike the conventional XRF analysis, the confocal modification provides us with the depth-resolved information on the elemental distribution. By depth profiling, it is possible to distinguish individual subsequent layers in multilayered samples in a non-destructive way. However, the obtained depth profiles do not directly describe the element density profiles (the real signal). In fact, it is a convolution of the real signal (influenced by absorption) with the spectrometer sensitivity function. Direct deconvolution approach for determining the element concentration profiles in weakly absorbing matrices was derived and validated by Wrobel and Czyzycki [1]. The authors applied a deconvolution with regularization and subsequently corrected the deconvolved signals for absorption effects. This was rendered possible supposing the local densities of all elements in the individual layers were known. In our work, a slightly different deconvolution method based on a diagonal loading technique was applied to the measured element depth profiles of self-prepared paint multilayers. The confocal micro-XRF measurements were performed using a tabletop confocal micro-XRF setup designed at the Department of Dosimetry and Application of Ionizing Radiation of the Czech Technical University in Prague. The setup is equipped with polycapillary X-ray optics both in excitation and detection channel. The spectrometer sensitivity function was established by depth profiling of a thin standard foils. Deconvolution was carried out using Matlab software. Although the absorption correction has not yet been applied to the depth profiles of the measured samples, the deconvolved signals help us to determine the layer boundaries more accurately than the original depth profiles.

Druh

O - Ostatní výsledky

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

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Návaznosti

S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů