Quadrupole lens-free multiple-profile diagnostics for emittance measurement of laser wakefield accelerated electron beams

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F16%3A00369530" target="_blank" >RIV/68407700:21340/16:00369530 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68378271:_____/16:00466848

Výsledek na webu

<a href="https://doi.org/10.1016/j.nima.2015.11.116" target="_blank" >https://doi.org/10.1016/j.nima.2015.11.116</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.nima.2015.11.116" target="_blank" >10.1016/j.nima.2015.11.116</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Quadrupole lens-free multiple-profile diagnostics for emittance measurement of laser wakefield accelerated electron beams

Popis výsledku v původním jazyce

A quadrupole lens-free diagnostic is a simple single shot method which can be used to measure the electron beam transverse emittance. LANEX screens are used as profile monitors due to the high yield of visible photons which can be easily detected by standard camera sensors. This type of minimally destructive diagnostics is particularly suitable for electron beams accelerated by the laser wakefield mechanism where the basic parameters of such beams fluctuate shot-to-shot mainly during the beam optimizing process. It allows to simultaneously measure the beam divergence, position, profile, pointing, and charge. The numerical study of the diagnostics performance and applicability range is presented and its limits are discussed. The influence of the LANEX screen multiple Coulomb scattering is studied by means of GEANT4; the unfolding procedure for multiple scattering contribution is presented. (C) 2015 Elsevier B.V. All rights reserved.

Název v anglickém jazyce

Quadrupole lens-free multiple-profile diagnostics for emittance measurement of laser wakefield accelerated electron beams

Popis výsledku anglicky

A quadrupole lens-free diagnostic is a simple single shot method which can be used to measure the electron beam transverse emittance. LANEX screens are used as profile monitors due to the high yield of visible photons which can be easily detected by standard camera sensors. This type of minimally destructive diagnostics is particularly suitable for electron beams accelerated by the laser wakefield mechanism where the basic parameters of such beams fluctuate shot-to-shot mainly during the beam optimizing process. It allows to simultaneously measure the beam divergence, position, profile, pointing, and charge. The numerical study of the diagnostics performance and applicability range is presented and its limits are discussed. The influence of the LANEX screen multiple Coulomb scattering is studied by means of GEANT4; the unfolding procedure for multiple scattering contribution is presented. (C) 2015 Elsevier B.V. All rights reserved.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Nuclear Instruments and Methods in Physics Research, Section A, Accelerators, Spectrometers, Detectors and Associated Equipment

ISSN

0168-9002

e-ISSN

1872-9576

Svazek periodika

810

Číslo periodika v rámci svazku

Feb

Stát vydavatele periodika

NL - Nizozemsko

Počet stran výsledku

5

Strana od-do

32-36

Kód UT WoS článku

000368632900006

EID výsledku v databázi Scopus

2-s2.0-84960927242