Depth of layers in historical materials measurable by X-ray fluorescence analysis

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F19%3A00331808" target="_blank" >RIV/68407700:21340/19:00331808 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1016/j.radphyschem.2018.06.047" target="_blank" >https://doi.org/10.1016/j.radphyschem.2018.06.047</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.radphyschem.2018.06.047" target="_blank" >10.1016/j.radphyschem.2018.06.047</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Depth of layers in historical materials measurable by X-ray fluorescence analysis

Popis výsledku v původním jazyce

Energy dispersive X-ray fluorescence analysis (EDXRF, further briefly XRF) is an analytical method which is of particular relevance for valuable artefacts in investigations of cultural heritage, such as paintings and frescoes, sculptures, objects of applied art etc., since it is non-invasive and non-destructive and it can be applied in-situ with portable instruments. However, it also has some disadvantages, one of them being the fact that it uses relatively soft X-rays with limited penetration ability. This means it is essentially a "surface" method analysing effectively only relatively thin surface layers of materials. The maximum depth from which analytical signal is still measurable depends on the material composition and density, the element which should be detected, and the geometrical arrangement of the measuring instrument. The paper summarises results of Monte Carlo calculations of the thicknesses of selected material layers used in fine and applied arts objects (paint, bronze and glass) which are reachable by XRF, for two commonly used geometrical arrangements of instruments (hand-held and confocal XRF). Examples chosen for these calculations are related to real practical investigations of artefacts in our laboratory. The results show that the layers which can be effectively analysed have thicknesses of the order of tens to hundreds of micrometres. Comparing the calculated values with the measured values shows the good agreement of the used calculation model with reality, so calculations can be beneficial for both planning and interpretation of experiments.

Název v anglickém jazyce

Depth of layers in historical materials measurable by X-ray fluorescence analysis

Popis výsledku anglicky

Energy dispersive X-ray fluorescence analysis (EDXRF, further briefly XRF) is an analytical method which is of particular relevance for valuable artefacts in investigations of cultural heritage, such as paintings and frescoes, sculptures, objects of applied art etc., since it is non-invasive and non-destructive and it can be applied in-situ with portable instruments. However, it also has some disadvantages, one of them being the fact that it uses relatively soft X-rays with limited penetration ability. This means it is essentially a "surface" method analysing effectively only relatively thin surface layers of materials. The maximum depth from which analytical signal is still measurable depends on the material composition and density, the element which should be detected, and the geometrical arrangement of the measuring instrument. The paper summarises results of Monte Carlo calculations of the thicknesses of selected material layers used in fine and applied arts objects (paint, bronze and glass) which are reachable by XRF, for two commonly used geometrical arrangements of instruments (hand-held and confocal XRF). Examples chosen for these calculations are related to real practical investigations of artefacts in our laboratory. The results show that the layers which can be effectively analysed have thicknesses of the order of tens to hundreds of micrometres. Comparing the calculated values with the measured values shows the good agreement of the used calculation model with reality, so calculations can be beneficial for both planning and interpretation of experiments.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

—

OECD FORD obor

10301 - Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)

Projekt

<a href="/cs/project/EF16_019%2F0000778" target="_blank" >EF16_019/0000778: Centrum pokročilých aplikovaných přírodních věd</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Rok uplatnění

2019

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Radiation Physics and Chemistry

ISSN

0969-806X

e-ISSN

1879-0895

Svazek periodika

155

Číslo periodika v rámci svazku

Feb

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

5

Strana od-do

239-243

Kód UT WoS článku

000454467400043

EID výsledku v databázi Scopus

2-s2.0-85049646318