Accidental coincidences in camera-based high-dimensional entanglement certification

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21340%2F25%3A00388636" target="_blank" >RIV/68407700:21340/25:00388636 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1364/OL.569075" target="_blank" >https://doi.org/10.1364/OL.569075</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1364/OL.569075" target="_blank" >10.1364/OL.569075</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Accidental coincidences in camera-based high-dimensional entanglement certification

Popis výsledku v původním jazyce

High-dimensional entangled states, such as spatially entangled photon pairs produced by spontaneous parametric down-conversion (SPDC), are a key resource for quantum technologies. In recent years, camera-based coincidence counting approaches have considerably improved the ability to characterize them in terms of speed and dimensionality. However, these methods have limitations, including in most of them the necessity to subtract accidental coincidences. Here, we study the role of these accidentals in entanglement certification for a single-photon avalanche diode (SPAD) array and an intensified time-stamping (Tpx3Cam) camera. Using both Einstein-Podolsky-Rosen (EPR) and entropy-based criteria, we show that the level of accidental coincidences-determined by the temporal characteristics of the camera-and whether they are subtracted critically impact entanglement certification. In particular, we demonstrate that current single-photon camera technologies enable entanglement certification without accidental subtraction only if a Gaussian approximation is applied to the measured two-photon state. Our work is important for developing quantum-optics applications in adversarial scenarios, such as high-dimensional quantum key distribution (HD-QKD) and also for loophole-free experimental testing of quantum foundations. (c) 2025 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.

Název v anglickém jazyce

Accidental coincidences in camera-based high-dimensional entanglement certification

Popis výsledku anglicky

High-dimensional entangled states, such as spatially entangled photon pairs produced by spontaneous parametric down-conversion (SPDC), are a key resource for quantum technologies. In recent years, camera-based coincidence counting approaches have considerably improved the ability to characterize them in terms of speed and dimensionality. However, these methods have limitations, including in most of them the necessity to subtract accidental coincidences. Here, we study the role of these accidentals in entanglement certification for a single-photon avalanche diode (SPAD) array and an intensified time-stamping (Tpx3Cam) camera. Using both Einstein-Podolsky-Rosen (EPR) and entropy-based criteria, we show that the level of accidental coincidences-determined by the temporal characteristics of the camera-and whether they are subtracted critically impact entanglement certification. In particular, we demonstrate that current single-photon camera technologies enable entanglement certification without accidental subtraction only if a Gaussian approximation is applied to the measured two-photon state. Our work is important for developing quantum-optics applications in adversarial scenarios, such as high-dimensional quantum key distribution (HD-QKD) and also for loophole-free experimental testing of quantum foundations. (c) 2025 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

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OECD FORD obor

10306 - Optics (including laser optics and quantum optics)

Projekt

—

Návaznosti

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Rok uplatnění

2025

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Optics Letters

ISSN

0146-9592

e-ISSN

1539-4794

Svazek periodika

50

Číslo periodika v rámci svazku

24

Stát vydavatele periodika

US - Spojené státy americké

Počet stran výsledku

4

Strana od-do

7532-7535

Kód UT WoS článku

001637536900005

EID výsledku v databázi Scopus

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