Characterization of thermoelectric multi-layered structures Ce0:09Fe0:67Co3:33Sb12/FeSb2:1Te prepared by laser ablation

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21460%2F13%3A00208340" target="_blank" >RIV/68407700:21460/13:00208340 - isvavai.cz</a>

Výsledek na webu

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DOI - Digital Object Identifier

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Jazyk výsledku

angličtina

Název v původním jazyce

Characterization of thermoelectric multi-layered structures Ce0:09Fe0:67Co3:33Sb12/FeSb2:1Te prepared by laser ablation

Popis výsledku v původním jazyce

Multi-layered Ce0:09Fe0:67Co3:33Sb12/-FeSb2:1Te structures composed of thin equidistant layers of di?erent thickness (2 nm, 3 nm and 5 nm) were prepared by Pulsed Laser Deposition on fused silica quartz glass substrates. The structures were prepared at substrate temperatures (230 °C or 250 °C) applying the same laser beam energy density (3 Jcm the contribution we present certain thermoelectric properties such as in-plane electrical conductivity, the Seebeck coe?cient and the power factor of the multi-layered structures in the temperature range from 300 Kto 500 K. X-ray di?raction patterns are also shown. A cross-sectional image of the multi-layered structure made by a Scanning Electron Microscope is preseted for the thicker multi-layered structure.

Název v anglickém jazyce

Characterization of thermoelectric multi-layered structures Ce0:09Fe0:67Co3:33Sb12/FeSb2:1Te prepared by laser ablation

Popis výsledku anglicky

Multi-layered Ce0:09Fe0:67Co3:33Sb12/-FeSb2:1Te structures composed of thin equidistant layers of di?erent thickness (2 nm, 3 nm and 5 nm) were prepared by Pulsed Laser Deposition on fused silica quartz glass substrates. The structures were prepared at substrate temperatures (230 °C or 250 °C) applying the same laser beam energy density (3 Jcm the contribution we present certain thermoelectric properties such as in-plane electrical conductivity, the Seebeck coe?cient and the power factor of the multi-layered structures in the temperature range from 300 Kto 500 K. X-ray di?raction patterns are also shown. A cross-sectional image of the multi-layered structure made by a Scanning Electron Microscope is preseted for the thicker multi-layered structure.

Druh

O - Ostatní výsledky

CEP obor

BH - Optika, masery a lasery

OECD FORD obor

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Projekt

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Návaznosti

V - Vyzkumna aktivita podporovana z jinych verejnych zdroju

Rok uplatnění

2013

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů