High-contrast X-ray micro-tomography of low attenuation samples using large area hybrid semiconductor pixel detector array of 10x5 Timepix chips

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A21670%2F16%3A00237517" target="_blank" >RIV/68407700:21670/16:00237517 - isvavai.cz</a>

Nalezeny alternativní kódy

RIV/68407700:21460/16:00237517 RIV/70979821:_____/16:N0000011

Výsledek na webu

<a href="http://iopscience.iop.org/article/10.1088/1748-0221/11/01/C01073/meta;jsessionid=286E19D56A63C3B38D0986D97458B92A.c4.iopscience.cld.iop.org" target="_blank" >http://iopscience.iop.org/article/10.1088/1748-0221/11/01/C01073/meta;jsessionid=286E19D56A63C3B38D0986D97458B92A.c4.iopscience.cld.iop.org</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/11/01/C01073" target="_blank" >10.1088/1748-0221/11/01/C01073</a>

Jazyk výsledku

angličtina

Název v původním jazyce

High-contrast X-ray micro-tomography of low attenuation samples using large area hybrid semiconductor pixel detector array of 10x5 Timepix chips

Popis výsledku v původním jazyce

State-of-the-art hybrid pixel semiconductor detectors provide excellent imaging properties such as unlimited dynamic range, high spatial resolution, high frame rate and energy sensitivity. Nevertheless, a limitation in the use of these devices for imaging has been the small sensitive area of a few square centimetres. In the field of microtomography we make use of a large area pixel detector assembled from 50 Timepix edgeless chips providing fully sensitive area of 14.3 x 7.15 cm2. We have successfully demonstrated that the enlargement of the sensitive area enables high-quality tomographic measurements of whole objects with high geometrical magnification without any significant degradation in resulting reconstructions related to the chip tilling and edgeless sensor technology properties. The technique of micro-tomography with the newly developed large area detector is applied for samples formed by low attenuation, low contrast materials such a seed from Phacelia tanacetifolia, a charcoalified wood sample and a beeswax seal sample.

Název v anglickém jazyce

High-contrast X-ray micro-tomography of low attenuation samples using large area hybrid semiconductor pixel detector array of 10x5 Timepix chips

Popis výsledku anglicky

State-of-the-art hybrid pixel semiconductor detectors provide excellent imaging properties such as unlimited dynamic range, high spatial resolution, high frame rate and energy sensitivity. Nevertheless, a limitation in the use of these devices for imaging has been the small sensitive area of a few square centimetres. In the field of microtomography we make use of a large area pixel detector assembled from 50 Timepix edgeless chips providing fully sensitive area of 14.3 x 7.15 cm2. We have successfully demonstrated that the enlargement of the sensitive area enables high-quality tomographic measurements of whole objects with high geometrical magnification without any significant degradation in resulting reconstructions related to the chip tilling and edgeless sensor technology properties. The technique of micro-tomography with the newly developed large area detector is applied for samples formed by low attenuation, low contrast materials such a seed from Phacelia tanacetifolia, a charcoalified wood sample and a beeswax seal sample.

Druh

J_x - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)

CEP obor

BG - Jaderná, atomová a molekulová fyzika, urychlovače

OECD FORD obor

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Projekt

<a href="/cs/project/GA15-04987S" target="_blank" >GA15-04987S: Nedestruktivní metody jako nástroj pro studium diversity křídových rostlin</a><br>

Návaznosti

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Instrumentation

ISSN

1748-0221

e-ISSN

—

Svazek periodika

11

Číslo periodika v rámci svazku

January

Stát vydavatele periodika

IT - Italská republika

Počet stran výsledku

8

Strana od-do

—

Kód UT WoS článku

000371469800073

EID výsledku v databázi Scopus

2-s2.0-84956998454