Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications

Kód výsledku v IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68407700%3A90072%2F16%3A00344171" target="_blank" >RIV/68407700:90072/16:00344171 - isvavai.cz</a>

Výsledek na webu

<a href="https://doi.org/10.1088/1748-0221/11/10/P10008" target="_blank" >https://doi.org/10.1088/1748-0221/11/10/P10008</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1088/1748-0221/11/10/P10008" target="_blank" >10.1088/1748-0221/11/10/P10008</a>

Jazyk výsledku

angličtina

Název v původním jazyce

Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications

Popis výsledku v původním jazyce

The EDELWEISS-III direct dark matter search experiment uses cryogenic HP-Ge detectors Fully covered with Inter-Digitized electrodes (FID). They are operated at lowfields (< 1 V/cm), and as a consequence charge-carrier trapping significantly affects both the ionization and heat energy measurements. This paper describes an analytical model of the signals induced by trapped charges in FID detectors based on the Shockley-Ramo theorem. It is used to demonstrate that veto electrodes, initially designed for the sole purpose of surface event rejection, can be used to provide a sensitivity to the depth of the energy deposits, characterize the trapping in the crystals, perform heat and ionization energy corrections and improve the ionization baseline resolutions. These procedures are applied successfully to actual data.

Název v anglickém jazyce

Signals induced by charge-trapping in EDELWEISS FID detectors: analytical modeling and applications

Popis výsledku anglicky

The EDELWEISS-III direct dark matter search experiment uses cryogenic HP-Ge detectors Fully covered with Inter-Digitized electrodes (FID). They are operated at lowfields (< 1 V/cm), and as a consequence charge-carrier trapping significantly affects both the ionization and heat energy measurements. This paper describes an analytical model of the signals induced by trapped charges in FID detectors based on the Shockley-Ramo theorem. It is used to demonstrate that veto electrodes, initially designed for the sole purpose of surface event rejection, can be used to provide a sensitivity to the depth of the energy deposits, characterize the trapping in the crystals, perform heat and ionization energy corrections and improve the ionization baseline resolutions. These procedures are applied successfully to actual data.

Druh

J_imp - Článek v periodiku v databázi Web of Science

CEP obor

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OECD FORD obor

10303 - Particles and field physics

Projekt

—

Návaznosti

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Rok uplatnění

2016

Kód důvěrnosti údajů

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Název periodika

Journal of Instrumentation

ISSN

1748-0221

e-ISSN

1748-0221

Svazek periodika

11

Číslo periodika v rámci svazku

P10008

Stát vydavatele periodika

IT - Italská republika

Počet stran výsledku

20

Strana od-do

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Kód UT WoS článku

000387876300008

EID výsledku v databázi Scopus

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