Filtry
Influence of Cross-Correlation of Rough Boundaries on Reflectance of Thin Films on GaAs and Si Substrates
is performed for rough thin films on GaAs and Si substrates. This analysis demonstratesIn this contribution the reflectance of thin films on semiconductor substrates with correlated randomly rough boundaries is an...
BH - Optika, masery a lasery
- 2009 •
- D
Rok uplatnění
D - Stať ve sborníku
Roughness effects in concentrated contact from full to mixed lubrication
of lubricant film thinning in recent decades. As a result, an impact of a surface roughness on the contact performance in machine components is increasing steadily. Surface roughness influences film thickness, pre...
Mechanical engineering
- 2018 •
- D •
- Odkaz
Rok uplatnění
D - Stať ve sborníku
Výsledek na webu
Optical characterization of inhomogeneous thin films with randomly rough boundaries exhibiting wide intervals of spatial frequencies
a smooth silicon surface while the latter film is deposited on a randomly rough silicon of the rough polymer-like film. Within the optical characterization, the spectral of the optical constants. Roughness
Optics (including laser optics and quantum optics)
- 2022 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Measurement of thickness distribution, optical constants, and roughness parameters of rough nonuniform ZnSe thin films
overlayers represented by thin films with identically rough boundaries are taken films, together with the parameters of roughness and thickness nonuniformity.Epitaxial ZnSe thin films exhibiting two impor...
BH - Optika, masery a lasery
- 2014 •
- Jx •
- Odkaz
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Temperature induced change of surface roughness of Au(111) epitaxial films on mica
Temperature induced change of surface roughness of Au(111) epitaxial films on mica...
BM - Fyzika pevných látek a magnetismus
- 1999 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Optical characterization of inhomogeneous thin films with randomly rough boundaries
was roughened by anodic oxidation. The inhomogeneous thin film with randomly rough the inhomogeneous thin film, transition layer, and identically rough boundaries was used of the studied inhomogeneous thin fil...
Coating and films
- 2022 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Optical characterization of inhomogeneous thin films with randomly rough boundaries
was roughened by anodic oxidation. The inhomogeneous thin film with randomly rough the inhomogeneous thin film, transition layer, and identically rough boundaries was used of the studied inhomogeneous thin fil...
Coating and films
- 2022 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Probing the Roughness of Porphyrin Thin Films with X-ray Photoelectron Spectroscopy
. This results in an error for rough films, and the magnitude of this error depends dependency to estimate the roughnesses of thin porphyrin films grown on rutile TiO2(110) tetraphenylporphyrin (CoTPP), without anc...
Fluids and plasma physics (including surface physics)
- 2020 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Ellipsometric and reflectometric characterization of thin films exhibiting thickness non-uniformity and boundary roughness
modeled by rough thin films with identically rough boundaries are taken into accountIn this paper epitaxial ZnSe thin films prepared by molecular beam epitaxy onto GaAs single crystal substrates exhibiting two def...
Condensed matter physics (including formerly solid state physics, supercond.)
- 2017 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Influence of shadowing on ellipsometric quantities of randomly rough surfaces and thin films
parameters of randomly rough surfaces and very thin films with randomly rough boundaries with respect to the influence of the shadowing between the irregularities of roughness is performed for several examples of ...
BH - Optika, masery a lasery
- 2008 •
- Jx
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
- 1 - 10 z 22 399