Filtry
Lattice tilt and strain mapped by X-ray scanning nanodiffraction in compositionally graded SiGe/Si microcrystals
The scanning X-ray nanodiffraction technique is used to reconstruct the three- dimensional (3D) distribution of lattice strain and Ge concentration in compositionally graded Si1-xGex microcrystals epitaxially grown on Si pillars....
Condensed matter physics (including formerly solid state physics, supercond.)
- 2018 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Reconstruction of crystal shapes by X-ray nanodiffraction from three-dimensional superlattices
Here it is shown that scanning nanodiffraction of synchrotron X-ray radiation can unravel the three-dimensional structure of epitaxial crystals containing a periodic superlattice underneath their faceted surface....
BM - Fyzika pevných látek a magnetismus
- 2014 •
- Jx •
- Odkaz
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
X-ray Nanodiffraction on a Single SiGe Quantum Dot inside a Functioning Field-Effect Transistor
For advanced electronic, optoelectronic, or mechanical nanoscale devices a detailed understanding of their structural properties and in particular the strain state within their active region is of utmost importance. We demonstrate that X-ray nano...
BM - Fyzika pevných látek a magnetismus
- 2011 •
- Jx •
- Odkaz
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Observation of individual stacking faults in GaN microcrystals by x-ray nanodiffraction
X-ray nanodiffraction was used for the investigation of basal stacking faults in a-GaN microcrystallites. The method made it possible to find the positions of individual stacking faults in a chosen crystallite, and the resulting positions we...
Condensed matter physics (including formerly solid state physics, supercond.)
- 2017 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Lattice bending in three-dimensional Ge microcrystals studied by X-ray nanodiffraction and modelling
Extending the functionality of ubiquitous Si-based microelectronic devices often requires combining materials with different lattice parameters and thermal expansion coefficients. In this paper, scanning X-ray nanodiffraction is used to map ...
BM - Fyzika pevných látek a magnetismus
- 2016 •
- Jx •
- Odkaz
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Evolution of stress fields during crack growth and arrest in a brittle-ductile CrN-Cr clamped-cantilever analysed by X-ray nanodiffraction and modelling
distributions were determined by in situ cross-sectional X-ray nanodiffraction...
Materials engineering
- 2021 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
Perfect crystals grown from imperfect interfaces
We prove by scanning X-ray nanodiffraction that mismatched Ge crystals epitaxially grown on deeply patterned Si substrates evolve into perfect structures away from the heavily islocated interface....
BM - Fyzika pevných látek a magnetismus
- 2013 •
- Jx •
- Odkaz
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Mapping strain fields induced in Zr-based bulk metallic glasses during in-situ nanoindentation by X-ray nanodiffraction
A pioneer in-situ synchrotron X-ray nanodiffraction approach for characterization and visualization of strain fields induced by nanoindentation in amorphousmaterials is introduced. In-situnanoindentation experiments were performed in transmi...
BL - Fyzika plasmatu a výboje v plynech
- 2016 •
- Jx •
- Odkaz
Rok uplatnění
Jx - Nezařazeno - Článek v odborném periodiku (Jimp, Jsc a Jost)
Výsledek na webu
Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction
The influence of ion irradiation on residual stress and microstructure of thin films is not fully understood. Here, 5 MeV Si2+ ions were used to irradiate a 7 mu m thick tungsten film prepared by magnetron sputtering. Cross-sectional X-ray nanodi...
Nano-materials (production and properties)
- 2021 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
X-ray nanodiffraction analysis of residual stresses in polysilicon electrodes of vertical power transistors
The influence of residual stress concentrations on the mechanical stability and functional properties of vertical power transistors is not fully understood. In this work, residual stresses are analyzed in two polycrystalline Si electrodes using synch...
Materials engineering
- 2022 •
- Jimp •
- Odkaz
Rok uplatnění
Jimp - Článek v periodiku v databázi Web of Science
Výsledek na webu
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