Bringing metrology to high-speed atomic force microscopy (HS-AFM)
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F17%3AN0000039" target="_blank" >RIV/00177016:_____/17:N0000039 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Bringing metrology to high-speed atomic force microscopy (HS-AFM)
Original language description
The high-speed AFM of NPL and University of Bristol has been turned into a traceable instrument. The scanning stages have been error mapped using both grating and optical interferometric techniques. Using high speed interferometry, errors in scanning stages have been mapped in real time and corrections applied to remove the effects of crosstalk and non ideal motion. The application of metrology increases the accuracy of the high-speed AFM measurements, enabling the generation of very large composite images.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
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Continuities
V - Vyzkumna aktivita podporovana z jinych verejnych zdroju
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 17th International Conference of the European Society for Precision Engineering and Nanotechnology
ISBN
9780995775107
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
373-374
Publisher name
The European Society for Precision Engineering and Nanotechnology
Place of publication
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Event location
Hannover, Germany
Event date
Jan 1, 2017
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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