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Publishable Summary On-wafer microwave metrology for future industrial applications (23IND10)

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00177016%3A_____%2F24%3AN0000045" target="_blank" >RIV/00177016:_____/24:N0000045 - isvavai.cz</a>

  • Result on the web

    <a href="https://www.euramet.org/research-innovation/search-research-projects/details/project/on-wafer-microwave-metrology-for-future-industrial-applications" target="_blank" >https://www.euramet.org/research-innovation/search-research-projects/details/project/on-wafer-microwave-metrology-for-future-industrial-applications</a>

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Publishable Summary On-wafer microwave metrology for future industrial applications (23IND10)

  • Original language description

    This project will strengthen the European semiconductor industry and facilitate the development of next-generation semiconductor technologies for established and emerging applications, e.g., 6G telecommunications, automotive radar sensors, and wearable electronics for healthcare. The project will develop new, accurate and traceable on-wafer measurement techniques for semiconductors. This includes using new quantum sensing concepts, artificial intelligence and new on-wafer techniques for characterising compound transistors operating up to 220 GHz, and novel 2D, thin-film and semiconductor materials. The project aim is to push beyond the uncertainties and traceability of current on-wafer microwave capabilities for millimetre-wave integrated circuits, particularly those based on compound semiconductors.

  • Czech name

  • Czech description

Classification

  • Type

    O - Miscellaneous

  • CEP classification

  • OECD FORD branch

    20201 - Electrical and electronic engineering

Result continuities

  • Project

    <a href="/en/project/9B24017" target="_blank" >9B24017: On-wafer microwave metrology for future industrial applications</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2024

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů