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Contactless resistivity and photoconductivity correlation to surface preparation of CdZnTe

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F14%3A10283177" target="_blank" >RIV/00216208:11320/14:10283177 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.apsusc.2014.07.104" target="_blank" >http://dx.doi.org/10.1016/j.apsusc.2014.07.104</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.apsusc.2014.07.104" target="_blank" >10.1016/j.apsusc.2014.07.104</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Contactless resistivity and photoconductivity correlation to surface preparation of CdZnTe

  • Original language description

    We investigated the influence of lapping, polishing and chemical etching of semi-insulating CdZnTe by the contactless resistivity and photoconductivity method. This method can determine the sample parameters independent of the type and quality of the metallization. We observed that the evaluated sample resistivity varies with the surface preparation method up to a factor of two. The photoconductivity anti-correlates with resistivity and it changes strongly within one order of magnitude. We determined acorrelation between surface roughness, oxide layer thickness and material resistivity. Deviation of the trends is visible with surface preparation by chemical etching. We propose an optimal surface treatment to maximize the resistivity and thus to decrease the dark current. (C) 2014 Elsevier B.V. All rights reserved.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA13-13671S" target="_blank" >GA13-13671S: X-ray detectors for high photon fluxes</a><br>

  • Continuities

    S - Specificky vyzkum na vysokych skolach<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Applied Surface Science

  • ISSN

    0169-4332

  • e-ISSN

  • Volume of the periodical

    315

  • Issue of the periodical within the volume

    Neuveden

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    5

  • Pages from-to

    144-148

  • UT code for WoS article

    000342360300022

  • EID of the result in the Scopus database