Ion electromigration in CdTe Schottky metal-semiconductor-metal structure

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F15%3A10315442" target="_blank" >RIV/00216208:11320/15:10315442 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26620/15:PU113960 RIV/68081723:_____/15:00463487

Result on the web

<a href="http://dx.doi.org/10.1016/j.ssi.2015.04.016" target="_blank" >http://dx.doi.org/10.1016/j.ssi.2015.04.016</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.1016/j.ssi.2015.04.016" target="_blank" >10.1016/j.ssi.2015.04.016</a>

Result language

angličtina

Original language name

Ion electromigration in CdTe Schottky metal-semiconductor-metal structure

Original language description

We measured current transients in metal-semiconductor- metal (M-S-M) structure with two Au Schottky contacts fabricated to low resistivity p-CdTe material and propose a new model considering the electromigration of ions in the depletion region formed atthe reversed biased Au-CdTe interface. We assume that the electric field confined in the depletion region causes at elevated temperatures electromigration of donor defects in the semiconductor bulk. The drift of these ions changes with time the value ofthe electric field at the Au-CdTe interface and the value of resistance of the depletion region. The correlation between this field and the value of the reversed electric current is determined from the shape of current-voltage characteristics of the structure. We explain the change of the current with time as a result of changing electric field at the interface. The I-R-V measurement on the studied sample reveals that the field dependence of barrier height due to the image force is the m

Czech name

—

Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

—

Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2015

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Solid State Ionics

ISSN

0167-2738

e-ISSN

—

Volume of the periodical

278

Issue of the periodical within the volume

1

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

6

Pages from-to

20-25

UT code for WoS article

000359887700004

EID of the result in the Scopus database

2-s2.0-84930958695