Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU95379" target="_blank" >RIV/00216305:26220/11:PU95379 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Low Frequency Noise and Ions Diffusion in the CdTe Bulk Single Crystals
Original language description
The effect of ions diffusion on time dependence of noise and polarization phenomena of CdTe bulk single crystals has been carried out. We evaluated the instability of the reverse current of the Schottky contact at the P-type CdTe and the Au interface bya model which considers the effects of deep acceptors. The results shows small detrapping time compared to the experimental measurements. We suggested the diffusion of ions in depletion region at the metal - semiconductor (M-S) interface causes an additional reduction of the barrier and may be considered as another responsible mechanism for the polarization effect.
Czech name
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Czech description
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Project
<a href="/en/project/GAP102%2F11%2F0995" target="_blank" >GAP102/11/0995: Electron transport, Noise and Diagnostic of Shottky and Autoemission Cathodes</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
21st International Conference on Noise and Fluctuations
ISBN
978-1-4577-0191-7
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
1-4
Publisher name
IEEE
Place of publication
Kanada
Event location
Toronto, Kanada
Event date
Jun 12, 2011
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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