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Technology and characterization of MIS structures with co-doped silicon nanocrystals (Si-NCs) embedded in hafnium oxide (HfOx) ultra-thin layers

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F17%3A10370561" target="_blank" >RIV/00216208:11320/17:10370561 - isvavai.cz</a>

  • Result on the web

    <a href="http://dx.doi.org/10.1016/j.mee.2017.05.050" target="_blank" >http://dx.doi.org/10.1016/j.mee.2017.05.050</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.mee.2017.05.050" target="_blank" >10.1016/j.mee.2017.05.050</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Technology and characterization of MIS structures with co-doped silicon nanocrystals (Si-NCs) embedded in hafnium oxide (HfOx) ultra-thin layers

  • Original language description

    In this work, the technology of the metal-insulator-semiconductor (MIS) structures with co-doped silicon nanocrystals (Si-NCs) embedded in hafnium oxide (HfOx) dielectric layer is presented. The results of structural and electrical characterization of the fabricated test structures are discussed. A good agreement between measurements of thickness of the Si-NC layers for the spectroscopic ellipsometry and AFM methods was obtained. The spectroscopic analysis demonstrated a presence of Si-NCs of optical properties similar to the monocrystalline silicon. A simulation of the capacitance-voltage-time and current-voltage-time characteristics gave results of a qualitative agreement with the measurement data. Comparative stress-and-sense measurements (I-t) for the MIS structures with and without silicon nanocrystals proved the essential difference resulting from the charging/discharging processes of the nanocrystals.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    10302 - Condensed matter physics (including formerly solid state physics, supercond.)

Result continuities

  • Project

    <a href="/en/project/8F15001" target="_blank" >8F15001: Nanophotonics with metal – group-IV-semiconductor nanocomposites: From single nanoobjects to functional ensembles</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2017

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Microelectronic Engineering

  • ISSN

    0167-9317

  • e-ISSN

  • Volume of the periodical

    178

  • Issue of the periodical within the volume

    JUN 25 2017

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    6

  • Pages from-to

    298-303

  • UT code for WoS article

    000404703800068

  • EID of the result in the Scopus database