Calculations of High-Frequency Noise Spectral Density of Different CdTe Metal-Semiconductor-Metal Schottky Contacts
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216208%3A11320%2F19%3A10400003" target="_blank" >RIV/00216208:11320/19:10400003 - isvavai.cz</a>
Alternative codes found
RIV/68081723:_____/19:00509581
Result on the web
<a href="https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=dbhEd2_z~K" target="_blank" >https://verso.is.cuni.cz/pub/verso.fpl?fname=obd_publikace_handle&handle=dbhEd2_z~K</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s11664-019-07612-w" target="_blank" >10.1007/s11664-019-07612-w</a>
Alternative languages
Result language
angličtina
Original language name
Calculations of High-Frequency Noise Spectral Density of Different CdTe Metal-Semiconductor-Metal Schottky Contacts
Original language description
An analytical approach for the study of high-frequency noise in different CdTe Schottky contacts is proposed. The model takes into account the fluctuations from three primary current sources: the leakage current through the Schottky barrier, the fluctuations of surface charge current, and the excess carrier density produced by light illumination (photocurrent). In particular, the current densities related to the perturbation of the electric field inside the whole structure and the free carrier fluctuations are used to determine the detectivity in the Giga and the Terahertz frequencies. It is shown that the current spectral density exhibits a resonance peak near 109 Hz due to the free carrier concentration. The excess carrier fluctuations show a negligible contribution to the total spectral current density. It was found that the Au-S-Au structure presents a high detectivity due to their low noise level of the leakage current. These findings and the detailed model describing the current fluctuation processes in the detector is crucial for the development of detection technology.
Czech name
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Czech description
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Classification
Type
J<sub>SC</sub> - Article in a specialist periodical, which is included in the SCOPUS database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2019
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Electronic Materials
ISSN
0361-5235
e-ISSN
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Volume of the periodical
48
Issue of the periodical within the volume
12
Country of publishing house
US - UNITED STATES
Number of pages
7
Pages from-to
7806-7812
UT code for WoS article
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EID of the result in the Scopus database
2-s2.0-85073795413