The Radon transform as a tool for 3D reciprocal-space mapping of epitaxial microcrystals
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14310%2F22%3A00127695" target="_blank" >RIV/00216224:14310/22:00127695 - isvavai.cz</a>
Result on the web
<a href="https://onlinelibrary.wiley.com/iucr/doi/10.1107/S1600576722004885" target="_blank" >https://onlinelibrary.wiley.com/iucr/doi/10.1107/S1600576722004885</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1107/S1600576722004885" target="_blank" >10.1107/S1600576722004885</a>
Alternative languages
Result language
angličtina
Original language name
The Radon transform as a tool for 3D reciprocal-space mapping of epitaxial microcrystals
Original language description
This work presents a new approach suitable for mapping reciprocal space in three dimensions with standard laboratory equipment and a typical X-ray diffraction setup. The method is based on symmetric and coplanar high-resolution X-ray diffraction, ideally realized using 2D X-ray pixel detectors. The processing of experimental data exploits the Radon transform commonly used in medical and materials science. It is shown that this technique can also be used for diffraction mapping in reciprocal space even if a highly collimated beam is not available. The application of the method is demonstrated for various types of epitaxial microcrystals on Si substrates. These comprise partially fused SiGe microcrystals that are tens of micrometres high, multiple-quantum-well structures grown on SiGe microcrystals and pyramid-shaped GaAs/Ge microcrystals on top of Si micropillars.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
<a href="/en/project/LQ1601" target="_blank" >LQ1601: CEITEC 2020</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of Applied Crystallography
ISSN
1600-5767
e-ISSN
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Volume of the periodical
55
Issue of the periodical within the volume
August
Country of publishing house
GB - UNITED KINGDOM
Number of pages
14
Pages from-to
823-836
UT code for WoS article
000837727900012
EID of the result in the Scopus database
2-s2.0-85135604952