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Strain relaxation in Ge microcrystals studied by high-resolution X-ray diffraction

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216224%3A14740%2F16%3A00089508" target="_blank" >RIV/00216224:14740/16:00089508 - isvavai.cz</a>

  • Result on the web

    <a href="http://onlinelibrary.wiley.com/doi/10.1002/pssa.201532643/abstract" target="_blank" >http://onlinelibrary.wiley.com/doi/10.1002/pssa.201532643/abstract</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1002/pssa.201532643" target="_blank" >10.1002/pssa.201532643</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Strain relaxation in Ge microcrystals studied by high-resolution X-ray diffraction

  • Original language description

    Deposition on patterned substrates is a promising method for obtaining high quality, strain and defect free heteroepitaxial layers. In this paper we investigate the crystalline structure of quasi-continuous Ge layers consisting of closely spaced microcrystals on a Si substrate patterned in the form of a regular net of lithographically defined squared based pillars. Lattice parameters, strain and degree of relaxation of the Ge microcrystals are measured by standard high-resolution X-ray diffraction using reciprocal space mapping. In particular, we focus on the impact of Si pillar size and spacing on the Ge crystal quality by analyzing how the bending of crystal lattice planes caused by thermal stress relaxation and random crystal tilts affect the width of the diffraction peaks.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2016

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE

  • ISSN

    1862-6300

  • e-ISSN

  • Volume of the periodical

    213

  • Issue of the periodical within the volume

    2

  • Country of publishing house

    DE - GERMANY

  • Number of pages

    7

  • Pages from-to

    463-469

  • UT code for WoS article

    000370188700038

  • EID of the result in the Scopus database