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In situ Analysis of Ga-ultra Thin Films by ToF-LEIS

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F06%3APU62922" target="_blank" >RIV/00216305:26210/06:PU62922 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    In situ Analysis of Ga-ultra Thin Films by ToF-LEIS

  • Original language description

    In the paper the ability of TOF-LEIS to monitor the growth of ultrathin Ga layers in situ is presented. The FWHM of the Ga peaks in the TOF-LEIS spectra showed a linear dependence on Ga coverage. The analysis of the Ga growth on two Si(111) substrates cleaned in two distinct ways (chemical etching and UHV thermal flashing) revealed changes in the Si peak evolution caused by different growth modes taking place on these two substrates. This has been proved by ex situ AFM measurements as well.

  • Czech name

    In-situ analýza ultratenkých vrstev Ga užitím ToF-LEIS

  • Czech description

    In-situ analýza ultratenkých vrstev Ga užitím ToF-LEIS

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2006

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Nuclear Instruments and Methods in Physics Research B

  • ISSN

    0168-583X

  • e-ISSN

  • Volume of the periodical

    249

  • Issue of the periodical within the volume

    1-2

  • Country of publishing house

    CZ - CZECH REPUBLIC

  • Number of pages

    4

  • Pages from-to

    318-321

  • UT code for WoS article

  • EID of the result in the Scopus database