Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F17%3APU123352" target="_blank" >RIV/00216305:26210/17:PU123352 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1002/sia.6134" target="_blank" >http://dx.doi.org/10.1002/sia.6134</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1002/sia.6134" target="_blank" >10.1002/sia.6134</a>
Alternative languages
Result language
angličtina
Original language name
Surface analysis of epitaxially grown GeSn alloys with Sn contents between 15% and 18%
Original language description
Metastable GeSn layers with rather high Sn content between 15% and 18% grown on Si substrates by molecular beam epitaxy were analyzed for the morphological changes on a surface before and after reaching critical layer parameters (thickness, Sn content, and growth temperature) for surface roughening. Atomic-force microscopy investigations were performed as a function of thickness and separately for varying Sn concentrations in the GeSn layer. Epitaxial growth of metastable, uniform GeSn (15% Sn content) layers is obtained up to a critical thickness which increases from about 80 to above 200 nm by reducing the nominal growth temperature from 160 to 140 °C. Phase separation of the complete layer into tin-rich surface protrusions and a Ge-rich matrix takes place beyond the critical thickness.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface and Interface Analysis
ISSN
0142-2421
e-ISSN
1096-9918
Volume of the periodical
49
Issue of the periodical within the volume
4
Country of publishing house
GB - UNITED KINGDOM
Number of pages
6
Pages from-to
297-302
UT code for WoS article
000397496800009
EID of the result in the Scopus database
2-s2.0-84986258358