About the information depth of backscattered electron imaging

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F17%3APU128750" target="_blank" >RIV/00216305:26210/17:PU128750 - isvavai.cz</a>
Alternative codes found
RIV/68081731:_____/17:00477097
Result on the web
<a href="https://onlinelibrary.wiley.com/doi/abs/10.1111/jmi.12542" target="_blank" >https://onlinelibrary.wiley.com/doi/abs/10.1111/jmi.12542</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1111/jmi.12542" target="_blank" >10.1111/jmi.12542</a>

Result language
angličtina
Original language name
About the information depth of backscattered electron imaging
Original language description
he information depth of imaging with backscattered electrons in the scanning electron microscope was measured directly by comparison of a planar view of a steel sample with buried precipitates with an image of a section cut through precipitates by means of a Focused Ion Beam attachment. The information depth was determined across the electron energy range of units of keV and the results were compared with information depths calculated from two published equations and simulated using widely available Monte Carlo‐based software. Recommendations are given for routine estimations of BSE information depths.
Czech name
—
Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20301 - Mechanical engineering

Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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