Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F00%3A42200002" target="_blank" >RIV/00216305:26220/00:42200002 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26220/00:PU24015

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Influence of the sample coating and the shape of the probe on the resolution in Scanning Near-Field Optical Microscopy

Original language description

Images obtained in Scanning Near-field Optical Microscopy (SNOM) depend strongly on the experimental conditions. The theoretical model taking into account a complex structure of samples (multilayers) and the general tip geometry is introduced. This modelcan be applied to the different SNOM configurations and for various sample-electromagnetic coupling factors.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/OC%20523.40" target="_blank" >OC 523.40: Nanostructures: Optical and Electrical Characteristics</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2000

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

CO-MAT-TECH 2000, 8. Medzinárodná vedecká konferencia, sv.4

ISBN

80-227-1413-5

ISSN

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e-ISSN

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Number of pages

6

Pages from-to

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Publisher name

Slovenská technická univerzita v Bratislave

Place of publication

Bratislava

Event location

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Event date

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Type of event by nationality

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UT code for WoS article

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