Charge carrier transport and noise of niobium capacitors
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30096" target="_blank" >RIV/00216305:26220/02:PU30096 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Charge carrier transport and noise of niobium capacitors
Original language description
A charge carriers transport mechanism and low frequency noise analysis has been performed on niobium capacitors to determine the mechanism of current flow and current noise sources, both in normal and reverse mode. The model of this MIS structure can beused to give a physical interpretation of rhe niobium capacitor characteristics and temperature dependences.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceeding of CARTS 2002 - 16th European Passive Components Conference
ISBN
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ISSN
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e-ISSN
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Number of pages
5
Pages from-to
32-36
Publisher name
Electronic Components Institute Internationale, Ltd.
Place of publication
SWINDON, England
Event location
Port St. Laurent, Francie
Event date
Oct 14, 2002
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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