Microplasma Noise in Semiconductor GaAsP diodes
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU30655" target="_blank" >RIV/00216305:26220/02:PU30655 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26220/03:PU39291
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Microplasma Noise in Semiconductor GaAsP diodes
Original language description
Random two-level or multiple-level current impulses may occur in electronic devices containing reverse biased p-n junctions in a certain operating mode. These impulses are usually rectangular, featuring constant amplitude, random pulse width and pulse origin time points. This phenomenon is generally ascribed to local avalanche breakdowns originating in p-n junction defect regions called microplasma regions. Based on experiment results, a two-state model of stochastic generation-recombination process hass been elaborated for the two-level impulse noise allowing to derive some statistical characteristics of this process. It can be shown that the distribution of the probability density w(t0) of the impulse separation t0 and the probability density w(t1) of the impulse width t1 have exponential courses. The power spectral density of the noise current is of a G-R process type and depends on the particular microplasma properties. From the viewpoint of noise diagnostics, the most important fe
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/GA103%2F01%2F1058" target="_blank" >GA103/01/1058: Electromagnetic and acoustic emission in solids</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Noise and Non-linearity Testing of Modern Electronic Components
ISBN
80-238-9094-8
ISSN
—
e-ISSN
—
Number of pages
5
Pages from-to
85-89
Publisher name
Ing. Zdeněk Novotný, CSc.
Place of publication
Brno
Event location
Brno
Event date
Sep 12, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—